X-rays structural analysis and thermal stability studies of the ternary compound α-AlFeSi
From literature data presently available, the decomposition temperature and the nature of the decomposition reaction of the ternary compound α-AlFeSi (also designated as α H or τ 5) are not clearly identified. Moreover, some uncertainties remain concerning its crystal structure. The crystallographic...
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Published in | Journal of solid state chemistry Vol. 184; no. 5; pp. 1120 - 1128 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Amsterdam
Elsevier Inc
01.05.2011
Elsevier |
Subjects | |
Online Access | Get full text |
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Summary: | From literature data presently available, the decomposition temperature and the nature of the decomposition reaction of the ternary compound
α-AlFeSi (also designated as
α
H or
τ
5) are not clearly identified. Moreover, some uncertainties remain concerning its crystal structure. The crystallographic structure and thermochemical behaviour of the ternary compound
α-AlFeSi were meticulously studied. The crystal structure of
α-AlFeSi was examined at room temperature from X-ray single crystal intensity data. It presents hexagonal symmetry, space group
P6
3
/mmc with unit cell parameters (293
K)
a=12.345(2)
Å and
c=26.210(3)
Å (
V=3459
Å
3). The average chemical formula obtained from refinement is Al
7.1Fe
2Si. From isothermal reaction-diffusion experiments and Differential Thermal Analysis, the title compound decomposes peritectically upon heating into
θ-Fe
4Al
13(Si),
γ-Al
3FeSi and a ternary Al-rich liquid. Under atmospheric pressure, the temperature of this reversible transformation has been determined to be 772±12
°C.
Partial representation of the crystal structure of the
α-Al
7.1Fe
2Si compound.
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The main findings of our work are: ► a detailed X-rays crystal structure determination of the ternary compound
α-AlFeSi. ► The precision of the silicon atoms positions in the crystal structure. ► A precised determination of the decomposition temperature of this compound. |
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ISSN: | 0022-4596 1095-726X |
DOI: | 10.1016/j.jssc.2011.03.025 |