Ion incorporation and exchange effects in porous silicon
We report an effect of alcaline metal ion incorporation into porous silicon (PS) structure from the electrolyte during anodic etching. Higher mass ions (K +, Rb +, Cs +) broaden the PS pore size distribution. After aging, these layers had light emission in the green range. Moreover, ion exchange eff...
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Published in | Solid state communications Vol. 87; no. 2; pp. 89 - 92 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Oxford
Elsevier Ltd
1993
Elsevier |
Subjects | |
Online Access | Get full text |
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Summary: | We report an effect of alcaline metal ion incorporation into porous silicon (PS) structure from the electrolyte during anodic etching. Higher mass ions (K
+, Rb
+, Cs
+) broaden the PS pore size distribution. After aging, these layers had light emission in the green range. Moreover, ion exchange effects are demonstrated using buffered chemical solutions. Although, ion exchange is clearly visible by interchange of characteristic organic infrared (IR) vibration lines, it does not change emission of PS. We suggest the presence of zeolite-type structures in PS, as an explanation to observed properties. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0038-1098 1879-2766 |
DOI: | 10.1016/0038-1098(93)90331-G |