Effect of Interlayer Coupling and Symmetry on High-Order Harmonic Generation from Monolayer and Bilayer Hexagonal Boron Nitride

High-order harmonic generation (HHG) is a fundamental process which can be simplified as the production of high energetic photons from a material subjected to a strong driving laser field. This highly nonlinear optical process contains rich information concerning the electron structure and dynamics...

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Bibliographic Details
Published inSymmetry (Basel) Vol. 14; no. 1; p. 84
Main Authors Kim, Dasol, Lee, Yeon, Chacón, Alexis, Kim, Dong-Eon
Format Journal Article
LanguageEnglish
Published Basel MDPI AG 01.01.2022
Subjects
Bilayers
Boron nitride
Coupling
dipole transition matrix element
Dynamic structural analysis
Electronic structure
Harmonic generations
hexagonal boron nitride
high-order harmonic generation
Holes (electron deficiencies)
interlayer coupling
Interlayers
inversion symmetry
Lasers
Monolayers
Onsite
Physicists
Physics
Spectrum analysis
Symmetry
tight-binding model
Two dimensional analysis
Two dimensional materials
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Summary:High-order harmonic generation (HHG) is a fundamental process which can be simplified as the production of high energetic photons from a material subjected to a strong driving laser field. This highly nonlinear optical process contains rich information concerning the electron structure and dynamics of matter, for instance, gases, solids and liquids. Moreover, the HHG from solids has recently attracted the attention of both attosecond science and condensed matter physicists, since the HHG spectra can carry information of electron-hole dynamics in bands and inter- and intra-band current dynamics. In this paper, we study the effect of interlayer coupling and symmetry in two-dimensional (2D) material by analyzing high-order harmonic generation from monolayer and two differently stacked bilayer hexagonal boron nitrides (hBNs). These simulations reveal that high-order harmonic emission patterns strongly depend on crystal inversion symmetry (IS), rotation symmetry and interlayer coupling.
ISSN:2073-8994
2073-8994
DOI:10.3390/sym14010084