Topology Optimization of Stressed Capacitive RF MEMS Switches

Geometry design can improve a capacitive radio-frequency microelectromechanical system switch's reliability by reducing the impacts of intrinsic biaxial stresses and stress gradients on the switch's membrane. Intrinsic biaxial stresses cause stress stiffening, whereas stress gradients caus...

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Bibliographic Details
Published inJournal of microelectromechanical systems Vol. 22; no. 1; pp. 206 - 215
Main Authors Philippine, M. A., Sigmund, O., Rebeiz, G. M., Kenny, T. W.
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.02.2013
Institute of Electrical and Electronics Engineers
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Summary:Geometry design can improve a capacitive radio-frequency microelectromechanical system switch's reliability by reducing the impacts of intrinsic biaxial stresses and stress gradients on the switch's membrane. Intrinsic biaxial stresses cause stress stiffening, whereas stress gradients cause out-of-plane curling. We use topology optimization to systematically generate designs, by minimizing stress stiffening, minimizing curling, or minimizing stress stiffening while constraining the curling behavior. We present the corresponding problem formulations and sensitivity derivations and discuss the role of key elements in the problem formulation.
ISSN:1057-7157
1941-0158
DOI:10.1109/JMEMS.2012.2224640