An infrared-scene projector digital model

In infrared-scene projectors, an inherent variability for each emitter element manifests itself as fixed-pattern noise, or nonuniformity. This is unacceptable for valid sensor performance evaluation tasks. This article describes an infrared-scene projector digital model that will be used to simulate...

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Bibliographic Details
Published inComputing in science & engineering Vol. 4; no. 2; pp. 58 - 65
Main Authors Manzardo, M.A., LeSueur, K.G.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.03.2002
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Algorithms
Computer simulation
Control systems
Digital
Electronic equipment testing
Image resolution
Image sensors
Mathematical models
Missiles
Nonuniformity
Optical control
Projection
Projectors
Resistors
Software testing
System testing
Tasks
Temperature measurement
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Summary:In infrared-scene projectors, an inherent variability for each emitter element manifests itself as fixed-pattern noise, or nonuniformity. This is unacceptable for valid sensor performance evaluation tasks. This article describes an infrared-scene projector digital model that will be used to simulate infrared-scene projection to assist algorithm development to eliminate this nonuniformity.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
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ISSN:1521-9615
1558-366X
DOI:10.1109/5992.988649