Design and Control of a Dual-Probe Atomic Force Microscope
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Published in | IEEE/ASME transactions on mechatronics Vol. 23; no. 1; pp. 424 - 433 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
01.02.2018
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Online Access | Get full text |
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ISSN: | 1083-4435 1941-014X |
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DOI: | 10.1109/TMECH.2017.2779241 |