Influence of core property on multi-electron process in slow collisions of isocharged sequence ions with neon

• Published in: Chinese physics B Vol. 19; no. 11; pp. 475 - 488
• Main Author: 卢荣春 于得洋 邵曹杰 阮芳芳 蔡晓红
• Format: Journal Article
• Language: English
• Published: IOP Publishing 01.11.2010
• Subjects: 多核心; 工艺性能; 电子俘获过程; 电子工艺; 离子碰撞; 经典过垒模型; 霓虹灯
• ISSN: 1674-1056; 2058-3834
• DOI: 10.1088/1674-1056/19/11/115202

Influence of core property on multi-electron process in the collisions of q = 6-9 and 11 isocharged sequence ions with Ne is investigated in the keV/u region. The cross-section ratios of double-, triple-, quadruple- and total multielectron processes to the single electron capture process as well as the partial ratios of different reaction channels to the relevant multi-electron process are measured by using position-sensitive and time-of-flight techniques. The experimental data are compared with the theoretical predictions including the extended classical over-barrier model, the molecular Columbic barrier model and the semi-empirical scaling law. Results show a core effect on multi-electron process of isocharge ions colliding with Neon, which is consistent with the results of Helium we obtained previously.