Feedback-induced voltage change of a Vertical-Cavity Surface-Emitting Laser as an active detection system for miniature optical scanning probe microscopes

We propose a novel detection technique for scanning probe microscopy based on the measuring of the feedback-induced voltage change of 780-nm VCSEL operating at constant current in far-field regime when we modulate mechanically the length of a coupled-cavity generating the feedback conditions. The vo...

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Bibliographic Details
Published inOptics express Vol. 14; no. 8; pp. 3396 - 3405
Main Authors Heinis, Dominique, Gorecki, Christophe, Bargiel, Sylwester, Cretin, Bernard
Format Journal Article
LanguageEnglish
Published United States Optical Society of America - OSA Publishing 17.04.2006
Subjects
Engineering Sciences
Optics
Photonic
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Summary:We propose a novel detection technique for scanning probe microscopy based on the measuring of the feedback-induced voltage change of 780-nm VCSEL operating at constant current in far-field regime when we modulate mechanically the length of a coupled-cavity generating the feedback conditions. The voltage change of the VCSEL is produced by light back reflected from the sample to the laser cavity. Two-dimensional image probing is successfully demonstrated with high temporal resolution, offering a viable solution for miniature parallel scanning probe optical microscopes, such as confocal microscope, where the use of a photodetector is avoided. This approach opens the possibility to perform imaging tasks in a low cost and hand-held miniature device with much improved effective-space.
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ISSN:1094-4087
1094-4087
DOI:10.1364/OE.14.003396