A 45 ps time digitizer with a two-phase clock and dual-edge two-stage interpolation in a field programmable gate array device
We present a time digitizer having 45 ps resolution, integrated in a field programmable gate array (FPGA) device. The time interval measurement is based on the two-stage interpolation method. A dual-edge two-phase interpolator is driven by the on-chip synthesized 250 MHz clock with precise phase adj...
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Published in | Measurement science & technology Vol. 20; no. 2; pp. 025108 - 025108 (11) |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
IOP Publishing
01.02.2009
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Online Access | Get full text |
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Summary: | We present a time digitizer having 45 ps resolution, integrated in a field programmable gate array (FPGA) device. The time interval measurement is based on the two-stage interpolation method. A dual-edge two-phase interpolator is driven by the on-chip synthesized 250 MHz clock with precise phase adjustment. An improved dual-edge double synchronizer was developed to control the main counter. The nonlinearity of the digitizer's transfer characteristic is identified and utilized by the dedicated hardware code processor for the on-the-fly correction of the output data. Application of presented ideas has resulted in the measurement uncertainty of the digitizer below 70 ps RMS over the time interval ranging from 0 to 1 s. The use of the two-stage interpolation and a fast FIFO memory has allowed us to obtain the maximum measurement rate of five million measurements per second. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0957-0233 1361-6501 |
DOI: | 10.1088/0957-0233/20/2/025108 |