Channel Coding for Nonvolatile Memory Technologies: Theoretical Advances and Practical Considerations

Every bit of information in a storage or memory device is bound by a multitude of performance specifications, and is subject to a variety of reliability impediments. At the other end, the physical processes tamed to remember our bits offer a constant source of risk to their reliability. These includ...

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Bibliographic Details
Published inProceedings of the IEEE Vol. 105; no. 9; pp. 1705 - 1724
Main Authors Dolecek, Lara, Cassuto, Yuval
Format Journal Article
LanguageEnglish
Published New York IEEE 01.09.2017
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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