Channel Coding for Nonvolatile Memory Technologies: Theoretical Advances and Practical Considerations
Every bit of information in a storage or memory device is bound by a multitude of performance specifications, and is subject to a variety of reliability impediments. At the other end, the physical processes tamed to remember our bits offer a constant source of risk to their reliability. These includ...
Saved in:
Published in | Proceedings of the IEEE Vol. 105; no. 9; pp. 1705 - 1724 |
---|---|
Main Authors | , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.09.2017
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Be the first to leave a comment!