Determination of photophysical rate constants for the non-protected fluid room temperature phosphorescence of several naphthalene derivatives

• Published in: Spectrochimica acta. Part A, Molecular and biomolecular spectroscopy Vol. 57; no. 6; pp. 1261 - 1270
• Main Authors: Li, Long-Di, Long, Wen-Qing, Tong, Ai-Jun
• Format: Journal Article
• Language: English
• Published: England Elsevier B.V 01.05.2001
• Subjects: Kinetics; Luminescence; Luminescence kinetic parameters; Naphthalene derivatives; Naphthalenes - chemistry; Non-protected fluid room temperature phosphorescence; Potassium iodide; Spectrophotometry, Ultraviolet - methods; Temperature; Thallium nitrate; Potassium iodide; Non-protected fluid room temperature phosphorescence; Naphthalene derivatives; Luminescence kinetic parameters; Thallium nitrate
• ISSN: 1386-1425
• DOI: 10.1016/S1386-1425(00)00471-6

The determination of kinetic parameters for luminescence processes is very important in understanding the phosphorescence process and the mechanisms of the heavy atom effect (HAE). In our previous work, we reported that room temperature phosphorescence (RTP) emission of many naphthalene derivatives can be induced directly from their aqueous solution without using any kind of protective medium, and the name Non-Protected Fluid Room Temperature Phosphorescence (NP-RTP) is suggested for this new type of RTP emission. In order to further understand this kind of luminescence phenomenon, the influence of heavy atom perturber (HAP) concentration on RTP lifetime of several naphthalene derivatives was studied in detail in this paper. The possibility of determination of photophysical parameters for emission of NP-RTP was explored based on the definition on the phosphorescence lifetime and the relation with the concentration of HAP in this paper. A static Stern–Volmer equation for phosphorescence was derived and the luminescence kinetic parameters were calculated. The results obtained by two different ways proved that photophysical parameters for RTP emission can be determined based on the changes of the RTP lifetime.