Formation and IR spectrum of monobridged Si2H4 isolated in solid argon
The infrared (IR) spectrum of monobridged Si2H4 (denoted as mbr-Si2H4) isolated in solid Ar was recorded, and a set of lines (in the major matrix site) observed at 858.3 cm−1, 971.5 cm−1, 999.2 cm−1, 1572.7 cm−1, 2017.7 cm−1, 2150.4 cm−1, and 2158.4 cm−1 were characterized. The species was produced...
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Published in | The Journal of chemical physics Vol. 152; no. 20; pp. 204308 - 204314 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
Melville
American Institute of Physics
29.05.2020
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Subjects | |
Online Access | Get full text |
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Summary: | The infrared (IR) spectrum of monobridged Si2H4 (denoted as mbr-Si2H4) isolated in solid Ar was recorded, and a set of lines (in the major matrix site) observed at 858.3 cm−1, 971.5 cm−1, 999.2 cm−1, 1572.7 cm−1, 2017.7 cm−1, 2150.4 cm−1, and 2158.4 cm−1 were characterized. The species was produced by the electron bombardment of an Ar matrix sample containing a small proportion of SiH4 during matrix deposition. Upon photolysis of the matrix samples using 365 nm and 160 nm light, the content of mbr-Si2H4 increased. The band positions, relative intensity ratios, and D-isotopic shift ratios of the observed IR features are generally in good agreement with those predicted by the B3LYP/aug-cc-pVTZ method. In addition, the photochemistry of the observed products was discussed. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 content type line 23 |
ISSN: | 0021-9606 1089-7690 1089-7690 |
DOI: | 10.1063/5.0010293 |