Formation and IR spectrum of monobridged Si2H4 isolated in solid argon

The infrared (IR) spectrum of monobridged Si2H4 (denoted as mbr-Si2H4) isolated in solid Ar was recorded, and a set of lines (in the major matrix site) observed at 858.3 cm−1, 971.5 cm−1, 999.2 cm−1, 1572.7 cm−1, 2017.7 cm−1, 2150.4 cm−1, and 2158.4 cm−1 were characterized. The species was produced...

Full description

Saved in:
Bibliographic Details
Published inThe Journal of chemical physics Vol. 152; no. 20; pp. 204308 - 204314
Main Authors Lin, Shu-Yu, Chou, Sheng-Lung, Lin, Meng-Yeh, Huang, Wen-Jian, Huang, Tzu-Ping, Wu, Yu-Jong
Format Journal Article
LanguageEnglish
Published Melville American Institute of Physics 29.05.2020
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:The infrared (IR) spectrum of monobridged Si2H4 (denoted as mbr-Si2H4) isolated in solid Ar was recorded, and a set of lines (in the major matrix site) observed at 858.3 cm−1, 971.5 cm−1, 999.2 cm−1, 1572.7 cm−1, 2017.7 cm−1, 2150.4 cm−1, and 2158.4 cm−1 were characterized. The species was produced by the electron bombardment of an Ar matrix sample containing a small proportion of SiH4 during matrix deposition. Upon photolysis of the matrix samples using 365 nm and 160 nm light, the content of mbr-Si2H4 increased. The band positions, relative intensity ratios, and D-isotopic shift ratios of the observed IR features are generally in good agreement with those predicted by the B3LYP/aug-cc-pVTZ method. In addition, the photochemistry of the observed products was discussed.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
content type line 23
ISSN:0021-9606
1089-7690
1089-7690
DOI:10.1063/5.0010293