Non-destructive microstructural analysis with depth resolution: application to seashells
Energy‐variable X‐ray diffraction at a synchrotron beamline has been used to control the X‐ray penetration depth and thus to study structural parameters in polycrystalline and textured materials with depth resolution. This approach was applied to the investigation of the depth evolution of microstru...
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Published in | Journal of applied crystallography Vol. 35; no. 5; pp. 594 - 599 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
5 Abbey Square, Chester, Cheshire CH1 2HU, England
Munksgaard International Publishers
01.10.2002
Blackwell |
Subjects | |
Online Access | Get full text |
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Summary: | Energy‐variable X‐ray diffraction at a synchrotron beamline has been used to control the X‐ray penetration depth and thus to study structural parameters in polycrystalline and textured materials with depth resolution. This approach was applied to the investigation of the depth evolution of microstructure in the nacre layer of bivalvia seashells. According to conventional X‐ray diffraction and scanning electron microscopy, the nacre layer in the seashells of Acanthocardia tuberculata under investigation consists of large [001]‐oriented lamellae packed nearly parallel to the inner shell surface. In this paper, attention is focused on the microstructural information that can be extracted from the shapes of diffraction profiles (line profile analysis) measured at X‐ray energies that are varied by small steps. Depth dependences of the thickness of the lamellae and the average microstrain fluctuation are revealed. |
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Bibliography: | ark:/67375/WNG-XC34RG0N-G ArticleID:JCRKS0127 istex:1DC54EAB60ED1B16054723B9433F562F5FDBAD7E |
ISSN: | 1600-5767 0021-8898 1600-5767 |
DOI: | 10.1107/S0021889802011160 |