Induction and repair of DNA double-strand breaks in the same dose range as the shoulder of the survival curve

• Published in: Radiation research Vol. 140; no. 2; p. 161
• Main Authors: Nevaldine, B, Longo, J A, Vilenchik, M, King, G A, Hahn, P J
• Format: Journal Article
• Language: English
• Published: United States 01.11.1994
• Subjects: Cell Survival - radiation effects; Cells, Cultured; DNA Damage; DNA Repair; Dose-Response Relationship, Radiation
• ISSN: 0033-7587
• DOI: 10.2307/3578898

We have used pulsed-field gel electrophoresis (PFGE) to test two hypotheses that have been proposed to explain the survival curves with shoulders which are characteristic of low-LET ionizing radiation: (1) Neutral elution studies of the induction of double-strand breaks (DSBs) have suggested that ionizing radiation might induce DSBs in a nonlinear fashion at low doses. (2) Based on analogies to enzyme kinetics, DSB repair might be saturating in the shoulder region. We quantified DSB induction and survival resulting from doses between 0 and 5 Gy spanning the shoulder region of the survival curve. We found that DSB induction was linear at all doses tested down to 0.5 Gy, the limits of sensitivity. Therefore, nonlinear DSB induction cannot account for the shape of the survival curve. To determine whether the DSB repair system was saturated in the shoulder region, we quantified the rate of DSB repair as a function of dose of X rays between 1.25 and 20 Gy. The repair of DSBs was exponential with half-times of repair constant for doses below 10 Gy, and averaged 28 min. We determined the initial rate of repair from the exponential repair kinetics for each dose. The initial rate of repair after radiation treatment increased linearly with dose up to at least 10 Gy. Therefore, saturating DSB repair cannot explain the shoulder of the survival curve.