Prediction of dislocation formation in epitaxial multilayers subject to in-plane loading

• Published in: Philosophical magazine (Abingdon, England) Vol. 85; no. 15; pp. 1575 - 1610
• Main Author: McCartney, L. N.
• Format: Journal Article
• Language: English
• Published: Abingdon Taylor & Francis Group 21.05.2005; Taylor and Francis
• Subjects: Condensed matter: structure, mechanical and thermal properties; Defects and impurities in crystals; microstructure; Exact sciences and technology; Linear defects: dislocations, disclinations; Physics; Structure of solids and liquids; crystallography; Theories and models of crystal defects; Elastic constants; Thick films; Theoretical study; Boundary conditions; Lattice parameters; Stress-strain relations; Dislocation density; Thickness; Multilayers; Edge dislocations; Stress distribution; Anisotropy; Stress effects
• ISSN: 1478-6435; 1478-6443
• DOI: 10.1080/14786430500036496

A theoretical model is described to predict equilibrium distributions of misfit dislocations in one or more anisotropic epitaxial layers of a multilayered system deposited on a thick substrate. Each layer is regarded as having differing elastic and lattice constants, and the system is subject to biaxial in-plane mechanical loading. A stress transfer methodology is developed enabling both the stress and displacement distributions in the system to be estimated for cases where the interacting dislocations are of a pure edge configuration. Energy methods are used to determine equilibrium distributions of the dislocations for given external applied stress states. It is shown that the new model accurately reproduces known exact analytical solutions for the special case of just one isotropic epitaxial layer applied to an isotropic semi-infinite substrate having the elastic constants of the substrate but differing lattice constants. The model is used to consider equilibrium dislocation distributions in capped epitaxial systems with misfit dislocations. It is shown that the simplifying assumptions often made in the literature, regarding the uniformity of elastic properties and the neglect of anisotropy, can lead to critical thicknesses being underestimated by 15-18%. The application of uniaxial tensile stresses increases the value of critical thicknesses. The model can be used to analyse dislocations in various non-neighbouring layers provided the dislocation density has the same value in all layers in which dislocations have formed. This type of analysis enables the prediction of the deformation of metallic multilayers subject to mechanical and thermal loading.