Hierarchical microstructures in CZT

Advanced characterization tools, such as electron backscatter diffraction and transmitted IR microscopy, are being applied to study critical microstructural features and orientation relations in as-grown CZT crystals to aid in understanding the relation between structure and properties in radiation...

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Published inNuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 652; no. 1; pp. 174 - 177
Main Authors Sundaram, S.K., Henager, C.H., Edwards, D.J., Schemer-Kohrn, A.L., Bliss, M., Riley, B.R., Toloczko, M.B., Lynn, K.G.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.10.2011
Subjects
CdZnTe
Crystal growth
CZT
Detectors
Dislocations
Electron backscatter diffraction
Hierarchical
Infrared microscopy
Microscopy
Microstructure
Microstructures
Networks
Radiation detectors
Spectrometers
Tellurium precipitate
Twin boundaries
Crystal growth
Hierarchical
Twin boundaries
Electron backscatter diffraction
CdZnTe
Infrared microscopy
Tellurium precipitate
Microstructures
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Summary:Advanced characterization tools, such as electron backscatter diffraction and transmitted IR microscopy, are being applied to study critical microstructural features and orientation relations in as-grown CZT crystals to aid in understanding the relation between structure and properties in radiation detectors. Even carefully prepared single crystals of CZT contain regions of slight misorientation, Te-particles, and dislocation networks that must be understood for more accurate models of detector response. This paper describes initial research at PNNL into the hierarchy of microstructures observed in CZT grown via the vertical gradient freeze or vertical Bridgman method at PNNL and WSU.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2010.09.128