Ultrathin tunable conducting oxide films for near-IR applications: an introduction to spectroscopy shape theory

We report tunable RF-sputtered AZO nanofilms through of deposition conditions. Perfect adsorption of light was simulated in ENZ mode. The coupling condition of thickness and wavelength in perfect absorption was obtained by a Drude model. The fitted parameters range as follows: charge density, from 1...

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Bibliographic Details
Published inSN applied sciences Vol. 1; no. 12; p. 1553
Main Authors Villarreal-Rios, A. L., Bedoya-Calle, Á. H., Caro-Lopera, F. J., Ortiz-Méndez, U., García-Méndez, M., Pérez-Ramírez, F. O.
Format Journal Article
LanguageEnglish
Published Cham Springer International Publishing 01.12.2019
Springer Nature B.V
Subjects
Applied and Technical Physics
Charge density
Chemistry/Food Science
Crystal oscillators
Earth Sciences
Engineering
Environment
Etching
Glass substrates
Materials Science
Oxide coatings
Physics: Smart Photonic and Optoelectronic Materials
Research Article
Spectroscopy
Thin films
Spectroscopy shape analysis
UV–VIS
AZO
Riemannian distances
Perfect absorption
XPS
Metamaterials
XRD
Epsilon-near-zero mode
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Summary:We report tunable RF-sputtered AZO nanofilms through of deposition conditions. Perfect adsorption of light was simulated in ENZ mode. The coupling condition of thickness and wavelength in perfect absorption was obtained by a Drude model. The fitted parameters range as follows: charge density, from 1.6 × 10 20 to 4.4 × 10 20 cm −3 ; mobilities, from 8.23 to 12.76 cm 2  V −1  s −1 ; and resistivities, from 14.20 to 34.98 Ω cm. The so-called spectroscopy shape analysis is introduced for automatic detection of elusive XPS peaks and sample surface-etching classification.
ISSN:2523-3963
2523-3971
DOI:10.1007/s42452-019-1569-y