Purcell effect investigation in organic Tamm plasmon structures

• Published in: Journal of physics. Conference series Vol. 1135; no. 1; pp. 12082 - 12085
• Main Authors: Morozov, K M, Ivanov, K A, Selenin, N, Mikhrin, S, Sa Pereira, D de, Menelaou, C, Monkman, A P, Kaliteevski, M A
• Format: Journal Article
• Language: English
• Published: Bristol IOP Publishing 01.12.2018
• Subjects: Decay rate; Emission spectra; Fluorescence; Silicon dioxide; Tantalum; Tantalum oxides
• ISSN: 1742-6588; 1742-6596
• DOI: 10.1088/1742-6596/1135/1/012082

We provide a theoretical and experimental investigation of a Purcell enhancement in a Tamm-plasmon based microcavity structure with an organic (4,4′-Bis(N-carbazolyl)−l,l′- biphenyl (CBP)) active layer. The microcavity structure was fabricated using several techniques as a magnetron deposition (Ta2O5/SiO2 dielectric Bragg mirror) and a thermal evaporation (CBP organic layer and silver layer on the top). Dependency of the modal Purcell factor on emission angle and frequency was calculated using S-quantization formalism. The emission spectra and the rate of fluorescence intensity decay of the Tamm structure was experimentally measured in ultraviolet region. We show, that at the frequencies corresponded to the Tamm plasmon resonance, the rate of the CBP molecule fluorescence decay increasing. Maximum registered value of the Purcell factor is close to 3.