Dynamic on-State Resistance Test and Evaluation of GaN Power Devices Under Hard- and Soft-Switching Conditions by Double and Multiple Pulses

The dynamic on-state resistance (RDSON) behavior of commercial GaN devices is very important for a GaN-based converter. Since the zero-voltage switching techniques are popular in high-frequency power conversion, a dynamic RDSON test board integrating both hard- and soft-switching test circuits is bu...

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Bibliographic Details
Published inIEEE transactions on power electronics Vol. 34; no. 2; pp. 1044 - 1053
Main Authors Li, Rui, Wu, Xinke, Yang, Shu, Sheng, Kuang
Format Journal Article
LanguageEnglish
Published New York IEEE 01.02.2019
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Computer simulation
Converters
Current collapse
Current measurement
dynamic <sc xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">on -state resistance
Electric potential
Electronic devices
Energy conversion
Gallium nitride
GaN devices
hard switching
Logic gates
Soft switching
Switches
Switching
Voltage measurement
Zero voltage switching
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Summary:The dynamic on-state resistance (RDSON) behavior of commercial GaN devices is very important for a GaN-based converter. Since the zero-voltage switching techniques are popular in high-frequency power conversion, a dynamic RDSON test board integrating both hard- and soft-switching test circuits is built in this study. Two types of commercial GaN devices are tested and compared under hard- and soft-switching conditions by double-pulse and multipulse test modes, respectively. It has been found that their dynamic RDSON exhibit different behaviors depending on the off-state voltage and frequency under hard- and soft-switching conditions due to different device technologies, which should be taken fully into account for GaN-based converter design and loss estimation. In order to simulate the RDSON behavior in a steady-state operating converter, a multipulse measurement has been implemented, the results of which are compared with that of double-pulse test. Furthermore, the primary trapping mechanisms responsible for dynamic RDSON increase under different switching conditions are identified and verified by the numerical device simulation using Silvaco TCAD tool.
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ISSN:0885-8993
1941-0107
DOI:10.1109/TPEL.2018.2844302