Perfect coverage test for flash converter

In this paper, a technique is presented that will produce a 100% coverage when testing an n-bit analog-to-digital flash converter. This technique is based on the pseudorandom test. An m-bit autonomous linear feedback shift register (ALFSR) is used to generate the test values. A general formula is de...

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Bibliographic Details
Published inInternational journal of electronics Vol. 95; no. 2; pp. 159 - 167
Main Authors Amer, Hassanein H., El Dahry, Rania S.
Format Journal Article
LanguageEnglish
Published London Taylor & Francis Group 01.01.2008
Taylor & Francis
Subjects
Applied sciences
Circuit properties
Coverage
Digital circuits
Electric, optical and optoelectronic circuits
Electronic circuits
Electronics
Exact sciences and technology
Fault model
Flash converter
Mixed-signal testing
Pseudorandom test
Signal convertors
Feedback regulation
Flash converter
Shift register
Digital converter
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Summary:In this paper, a technique is presented that will produce a 100% coverage when testing an n-bit analog-to-digital flash converter. This technique is based on the pseudorandom test. An m-bit autonomous linear feedback shift register (ALFSR) is used to generate the test values. A general formula is derived that relates the number of bits in the Flash Converter's output, the number of bits in the ALFSR and the uncertainty in the analog test values. The maximum allowable level of uncertainty is also obtained, in order to guarantee a perfect coverage.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0020-7217
1362-3060
DOI:10.1080/00207210801915717