Perfect coverage test for flash converter
In this paper, a technique is presented that will produce a 100% coverage when testing an n-bit analog-to-digital flash converter. This technique is based on the pseudorandom test. An m-bit autonomous linear feedback shift register (ALFSR) is used to generate the test values. A general formula is de...
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Published in | International journal of electronics Vol. 95; no. 2; pp. 159 - 167 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
London
Taylor & Francis Group
01.01.2008
Taylor & Francis |
Subjects | |
Online Access | Get full text |
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Summary: | In this paper, a technique is presented that will produce a 100% coverage when testing an n-bit analog-to-digital flash converter. This technique is based on the pseudorandom test. An m-bit autonomous linear feedback shift register (ALFSR) is used to generate the test values. A general formula is derived that relates the number of bits in the Flash Converter's output, the number of bits in the ALFSR and the uncertainty in the analog test values. The maximum allowable level of uncertainty is also obtained, in order to guarantee a perfect coverage. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0020-7217 1362-3060 |
DOI: | 10.1080/00207210801915717 |