Quantitative Texture Analysis from X-ray Diffraction Spectra

A method to obtain the orientation distribution function (ODF) of a polycrystalline material directly from X‐ray diffraction spectra is presented. It uses the maximum‐texture‐entropy assumption to reduce the diffraction data needed for the ODF analysis. The validity of this new method is illustrated...

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Bibliographic Details
Published inJournal of applied crystallography Vol. 30; no. 4; pp. 443 - 448
Main Authors Wang, Y. D., Zuo, L., Liang, Z. D., Laruelle, C., Vadon, A., Heizmann, J. J.
Format Journal Article
LanguageEnglish
Published 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.08.1997
Blackwell
Subjects
Cross-disciplinary physics: materials science; rheology
Exact sciences and technology
Materials science
Methods of crystal growth; physics of crystal growth
Physics
Theory and models of crystal growth; physics of crystal growth, crystal morphology and orientation
Algorithms
Line shape
Polycrystals
XRD
Maximum entropy method
Texture
Calculation methods
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Summary:A method to obtain the orientation distribution function (ODF) of a polycrystalline material directly from X‐ray diffraction spectra is presented. It uses the maximum‐texture‐entropy assumption to reduce the diffraction data needed for the ODF analysis. The validity of this new method is illustrated through two model examples.
Bibliography:ark:/67375/WNG-238K1KDX-5
istex:E4028520C0DF90F966FF09059EB82E201EDD216A
ArticleID:JCRHN0058
ISSN:1600-5767
0021-8898
1600-5767
DOI:10.1107/S0021889897000186