Estimation of the background in powder diffraction patterns through a robust smoothing procedure

A procedure is described for estimating the background outline in powder diffraction patterns. It essentially consists of an extension of traditional smoothing procedures to include Bragg peaks in addition to profile random fluctuations. This approach is particularly suited for dealing with diffract...

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Bibliographic Details
Published inJournal of applied crystallography Vol. 33; no. 3-2; pp. 977 - 979
Main Author Brückner, Sergio
Format Journal Article
LanguageEnglish
Published 5 Abbey Square, Chester, Cheshire CH1 2HU, England Munksgaard International Publishers 01.06.2000
Blackwell
Subjects
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Single-crystal and powder diffraction
Structure of solids and liquids; crystallography
X-ray diffraction and scattering
Diffraction pattern analysis
Smoothing methods
Powder pattern
Estimation
Structure resolution
Theoretical study
XRD
Background noise
Polymers
Organic compounds
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Summary:A procedure is described for estimating the background outline in powder diffraction patterns. It essentially consists of an extension of traditional smoothing procedures to include Bragg peaks in addition to profile random fluctuations. This approach is particularly suited for dealing with diffraction patterns obtained from semicrystalline polymer samples; some applications to this kind of experimental data are presented.
Bibliography:ark:/67375/WNG-WQ7591K8-N
ArticleID:JCRVI0131
istex:6731341A3258A8313868426799748C27DB469983
ISSN:1600-5767
0021-8898
1600-5767
DOI:10.1107/S0021889800003617