Photoreflectance spectroscopy study of vertical cavity surface emitting laser structures

This paper summarises the application of the laser-based electro-absorptive technique of photoreflectance (PR) for the study of vertical cavity surface emitting lasers (VCSELs). PR results are shown to reveal the technologically important cavity mode and ground state quantum well exciton structures....

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Bibliographic Details
Published inThin solid films Vol. 450; no. 1; pp. 148 - 150
Main Authors Murtagh, M.E., Guenebaut, V., Ward, S., Nee, D., Kelly, P.V., O'Looney, B., Murphy, F., Modreanu, M., Westwater, S., Blunt, R., Bland, S.W.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Lausanne Elsevier B.V 22.02.2004
Elsevier Science
Subjects
Cavity
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Lasers
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures
Optics
Photoluminescence
Photoreflectance
Physics
Quantum well
Quantum wells
Semiconductor lasers; laser diodes
Semiconductors
VCSEL
Visible and ultraviolet spectra
Photoreflectance
Quantum well
Cavity
VCSEL
Photoluminescence
Aluminium arsenides
Gallium arsenides
Inorganic compounds
Ternary compounds
Quantum wells
Binary compounds
Cavity: Photoluminescence
Experimental study
Excitons
Semiconductor lasers
III-V semiconductors
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Summary:This paper summarises the application of the laser-based electro-absorptive technique of photoreflectance (PR) for the study of vertical cavity surface emitting lasers (VCSELs). PR results are shown to reveal the technologically important cavity mode and ground state quantum well exciton structures. AlGaAs/GaAs based quantum well VCSELs were examined with and without top mirror layers as a function of laser pump excitation conditions, with results compared with angle-dependent PR data. Cavity mode and quantum well alignments were also studied with reference to the un-modulated reflectance signal as well as correlated with photoluminescence data. The results demonstrate the importance of PR metrology for state-of-art VCSEL characterisation.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2003.10.060