Island grains of low misorientation angles formed during abnormal grain growth in Cu

In this work, the earlier suggestion by Rosi et al. on the basis of the nearly parallel twins that the island grains trapped in the large grains during abnormal grain growth (AGG) in Ag have small misorientation angles has been confirmed by electron backscattered pattern (EBSP) in Cu. The formation...

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Published inMetallurgical and materials transactions. A, Physical metallurgy and materials science Vol. 31; no. 5; pp. 1489 - 1491
Main Authors JAE BON KOO, DUK YONG YOON, HENRY, M. F
Format Journal Article
LanguageEnglish
Published New York, NY Springer 01.05.2000
Springer Nature B.V
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Summary:In this work, the earlier suggestion by Rosi et al. on the basis of the nearly parallel twins that the island grains trapped in the large grains during abnormal grain growth (AGG) in Ag have small misorientation angles has been confirmed by electron backscattered pattern (EBSP) in Cu. The formation of the island grains is consistent with the low mobility and energy of the low angle grain boundaries. The island grains shrink and disappear during further annealing treatments. Precise measurement of the shrinkage rate might be useful for determining the migration mechanism of these grain boundaries. The possibility that the grains of even large misorientation angles might be also trapped in the growing grains under certain conditions needs to be further examined.
Bibliography:ObjectType-Article-2
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Korea Ministry of Science and Technology
ISSN:1073-5623
1543-1940
DOI:10.1007/s11661-000-0267-z