Surface plasmon enhanced transmission through planar gold quasicrystals fabricated by focused ion beam technique

• Published in: Microelectronic engineering Vol. 86; no. 4; pp. 1131 - 1133
• Main Authors: Xue, Jing, Zhou, Wen-Zhe, Dong, Bi-Qin, Wang, Xu, Chen, Yifang, Huq, Ejaz, Zeng, Wei, Qu, Xin-Ping, Liu, Ran
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier B.V 01.04.2009; Elsevier
• Subjects: Applied sciences; Electronics; Enhanced transmission; Exact sciences and technology; Microelectronic fabrication (materials and surfaces technology); Quasicrystal; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Surface plasmon; Surface plasmon; Quasicrystal; Enhanced transmission; Microelectronic fabrication; Fourier transformation; Diffraction pattern; Lattice parameters; Focused ion beam technology; Thin film; Planar technology
• ISSN: 0167-9317; 1873-5568
• DOI: 10.1016/j.mee.2008.11.090

We have applied focused ion beam (FIB) technique to fabricate planar quasicrystals in thin gold films. Transmission spectra of these quasicrystals are observed with strong dependence on the lattice parameters, indicating that the resonances can be ascribed to the effect of horizontal surface plasmon (SP) on both metal–air and metal–glass interfaces. Multiple SP modes excited in the quasicrystal give rise to the enhanced transmission in a wide wavelength range. The diffraction pattern through the quasicrystal exhibits 10-fold rotation symmetry and a dense distribution, which is in good agreement with that from the Fourier transform.