Simulation and optimization of a 6H-SiC metal-semiconductor-metal ultraviolet photodetector

Based on thermionic emission theory,a model of a 6H-SiC metal-semiconductor-metal(MSM) ultraviolet photodetector is established with the simulation package ISE-TCAD.A device with 3μm electrode width(W) and 3μm electrode spacing(L) is simulated.The findings show that the MSM photodetector has quite a...

Full description

Saved in:
Bibliographic Details
Published inJournal of semiconductors Vol. 31; no. 6; pp. 65 - 69
Main Author 陈斌 杨银堂 李跃进 刘红霞
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.06.2010
Subjects
Online AccessGet full text
ISSN1674-4926
DOI10.1088/1674-4926/31/6/064010

Cover

More Information
Summary:Based on thermionic emission theory,a model of a 6H-SiC metal-semiconductor-metal(MSM) ultraviolet photodetector is established with the simulation package ISE-TCAD.A device with 3μm electrode width(W) and 3μm electrode spacing(L) is simulated.The findings show that the MSM photodetector has quite a low dark current of 15 pA at 10V bias and the photocurrent is two orders of magnitude higher than the dark current.The influences of different structures on dark and illuminated current-voltage characteristics of the MSM photodetector are investigated to optimize the device parameters.Simulation results indicate that the maximum photocurrent and the highest ratio of photocurrent to dark current at 15 V bias are 5.3 nA and 327 with device parameters of W=6μm,L=3μm and W =3μm,L=6μm,respectively.
Bibliography:MSM structure; ultraviolet photodetector; Schottky contact; I-V characteristics
TN304.9
Schottky contact
ultraviolet photodetector
I-V characteristics
MSM structure
11-5781/TN
TN23
ISSN:1674-4926
DOI:10.1088/1674-4926/31/6/064010