Development of a very large-area ultraviolet imprint lithography process
We propose a very large-area ultraviolet imprint lithography process as a promising alternative to expensive conventional optical lithography for the production of display panels. This process uses a large-area hard stamp in a low vacuum environment. The hard quartz stamp is used to achieve high ove...
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Published in | Microelectronic engineering Vol. 86; no. 10; pp. 1983 - 1988 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
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Amsterdam
Elsevier B.V
01.10.2009
Elsevier |
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Abstract | We propose a very large-area ultraviolet imprint lithography process as a promising alternative to expensive conventional optical lithography for the production of display panels. This process uses a large-area hard stamp in a low vacuum environment. The hard quartz stamp is used to achieve high overlay accuracy, and the vacuum environment is required to ensure that air bubble defects do not occur during imprinting. We demonstrate that the quartz stamp with microscale patterns can be used for imprinting 18-in. diagonal substrates via single-step UV imprint in a low vacuum environment to obtain a practical residual layer thickness (RLT) for micro pattern transfer to the substrate. Numerical analysis is performed to clarify the physical phenomena underlying imprint process. |
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AbstractList | We propose a very large-area ultraviolet imprint lithography process as a promising alternative to expensive conventional optical lithography for the production of display panels. This process uses a large- area hard stamp in a low vacuum environment. The hard quartz stamp is used to achieve high overlay accuracy, and the vacuum environment is required to ensure that air bubble defects do not occur during imprinting. We demonstrate that the quartz stamp with microscale patterns can be used for imprinting 18-in. diagonal substrates via single-step UV imprint in a low vacuum environment to obtain a practical residual layer thickness (RLT) for micro pattern transfer to the substrate. Numerical analysis is performed to clarify the physical phenomena underlying imprint process. |
Author | Kim, Ki-don Park, Sang-hu Choi, Jun-hyuk Lee, Eung-sug Jeong, Jun-ho Choi, Dae-geun |
Author_xml | – sequence: 1 givenname: Ki-don surname: Kim fullname: Kim, Ki-don email: kdkim@kimm.re.kr organization: Nano-mechanical System Research Center, Korea Institute of Machinery and Materials, 171 Jang-dong, Yuseong-gu, Daejeon 305-33, Republic of Korea – sequence: 2 givenname: Jun-ho surname: Jeong fullname: Jeong, Jun-ho organization: Nano-mechanical System Research Center, Korea Institute of Machinery and Materials, 171 Jang-dong, Yuseong-gu, Daejeon 305-33, Republic of Korea – sequence: 3 givenname: Sang-hu surname: Park fullname: Park, Sang-hu organization: Department of Mechanical Engineering, Pusan National University, San 30 Jangjeon-dong, Geumjeong-gu, Busan 609-735, Republic of Korea – sequence: 4 givenname: Dae-geun surname: Choi fullname: Choi, Dae-geun organization: Nano-mechanical System Research Center, Korea Institute of Machinery and Materials, 171 Jang-dong, Yuseong-gu, Daejeon 305-33, Republic of Korea – sequence: 5 givenname: Jun-hyuk surname: Choi fullname: Choi, Jun-hyuk organization: Nano-mechanical System Research Center, Korea Institute of Machinery and Materials, 171 Jang-dong, Yuseong-gu, Daejeon 305-33, Republic of Korea – sequence: 6 givenname: Eung-sug surname: Lee fullname: Lee, Eung-sug organization: Nano-mechanical System Research Center, Korea Institute of Machinery and Materials, 171 Jang-dong, Yuseong-gu, Daejeon 305-33, Republic of Korea |
BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=21753615$$DView record in Pascal Francis |
BookMark | eNp9kM1OwzAQhC1UJErhAbjlArcEO44dR5xQ-SlSJS5wthxn07py4mCnkfr2uGrFkdNqpW9mducazXrXA0J3BGcEE_64yzqALMdYZCTPMBcXaE5ESVPGuJiheWTKtKKkvELXIexw3Ass5mj1AhNYN3TQj4lrE5VM4A-JVX4DqfKgkr0dvZqMszAmphu8iaA149ZtvBq2h2TwTkMIN-iyVTbA7Xku0Pfb69dyla4_3z-Wz-tUUybGlFYFpzkrasJ5xQmuBBRQKFFXdQ6sohWmtW4bChw3mGIguGgqrlqma0FJXdIFejj5xtyfPYRRdiZosFb14PZB0qKkgnEWQXICtXcheGhlvL1T_iAJlsfO5E7GzuSxM0lyGTuLmvuzuQpa2darXpvwJ8xJySgnR--nEwfx08mAl0Eb6DU0xoMeZePMPym_9uiC_A |
CODEN | MIENEF |
CitedBy_id | crossref_primary_10_1007_s13391_013_6027_1 crossref_primary_10_1016_j_matchemphys_2011_10_040 crossref_primary_10_1088_0957_4484_22_18_185301 crossref_primary_10_1016_j_apsusc_2013_05_089 crossref_primary_10_7567_JJAP_51_06FJ01 crossref_primary_10_1143_JJAP_51_06FJ01 crossref_primary_10_1007_s10971_011_2562_0 crossref_primary_10_3390_su152115638 crossref_primary_10_1039_c0cs00138d crossref_primary_10_1016_j_matchemphys_2018_03_082 crossref_primary_10_1557_opl_2012_9 |
Cites_doi | 10.1116/1.1545736 10.1116/1.588605 10.1088/0960-1317/15/2/008 10.1016/S0167-9317(02)00511-7 10.1143/JJAP.41.4178 10.1143/JJAP.41.4173 10.1016/S0167-9317(01)00536-6 10.1088/0957-4484/16/9/076 10.1088/0960-1317/16/10/008 10.1016/j.mee.2004.04.003 10.1063/1.114851 10.1063/1.1452260 10.1016/S0167-9317(00)00369-5 10.1016/j.mee.2005.05.004 10.1016/j.mee.2004.05.010 |
ContentType | Journal Article |
Copyright | 2009 Elsevier B.V. 2009 INIST-CNRS |
Copyright_xml | – notice: 2009 Elsevier B.V. – notice: 2009 INIST-CNRS |
DBID | IQODW AAYXX CITATION 7SP 8FD L7M |
DOI | 10.1016/j.mee.2008.12.068 |
DatabaseName | Pascal-Francis CrossRef Electronics & Communications Abstracts Technology Research Database Advanced Technologies Database with Aerospace |
DatabaseTitle | CrossRef Technology Research Database Advanced Technologies Database with Aerospace Electronics & Communications Abstracts |
DatabaseTitleList | Technology Research Database |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Applied Sciences |
EISSN | 1873-5568 |
EndPage | 1988 |
ExternalDocumentID | 10_1016_j_mee_2008_12_068 21753615 S0167931708006965 |
GroupedDBID | --K --M .~1 0R~ 123 1B1 1RT 1~. 1~5 29M 4.4 457 4G. 5VS 7-5 71M 8P~ 9JN AABNK AABXZ AACTN AAEDT AAEDW AAEPC AAIAV AAIKJ AAKOC AALRI AAOAW AAQFI AAQXK AAXUO AAYFN ABBOA ABFNM ABFRF ABJNI ABMAC ABNEU ABXDB ABXRA ABYKQ ACDAQ ACFVG ACGFO ACGFS ACNNM ACRLP ACZNC ADBBV ADEZE ADJOM ADMUD ADTZH AEBSH AECPX AEFWE AEKER AENEX AEZYN AFFNX AFKWA AFRZQ AFTJW AGHFR AGUBO AGYEJ AHHHB AHJVU AHZHX AIALX AIEXJ AIKHN AITUG AIVDX AJBFU AJOXV ALMA_UNASSIGNED_HOLDINGS AMFUW AMRAJ AOUOD ASPBG AVWKF AXJTR AZFZN BBWZM BJAXD BKOJK BLXMC CS3 DU5 EBS EFJIC EFLBG EJD EO8 EO9 EP2 EP3 F0J FDB FEDTE FGOYB FIRID FNPLU FYGXN G-2 G-Q G8K GBLVA GBOLZ HLZ HMV HVGLF HX~ HZ~ IHE J1W JJJVA KOM LG9 LY7 M24 M38 M41 MAGPM MO0 N9A NDZJH O-L O9- OAUVE OGIMB OZT P-8 P-9 P2P PC. Q38 R2- RIG RNS ROL RPZ SBC SDF SDG SDP SES SET SEW SMS SPC SPCBC SPD SPG SSM SSQ SST SSV SSZ T5K UHS WUQ XFK ZMT ~G- AAPBV ABPIF ABPTK IQODW AAXKI AAYXX AFJKZ AKRWK CITATION 7SP 8FD L7M |
ID | FETCH-LOGICAL-c358t-39463254b166961098e4e4a8b9b2e593903bcfd3e60d030e104d96af5cb831b73 |
IEDL.DBID | AIKHN |
ISSN | 0167-9317 |
IngestDate | Thu Aug 15 22:43:58 EDT 2024 Thu Sep 26 16:10:06 EDT 2024 Sun Oct 22 16:06:05 EDT 2023 Fri Feb 23 02:22:30 EST 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 10 |
Keywords | Vacuum environment Auto release Ultraviolet imprint process Hard stamp Microelectronic fabrication Patterning UV lithography Numerical method Photolithography |
Language | English |
License | CC BY 4.0 |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c358t-39463254b166961098e4e4a8b9b2e593903bcfd3e60d030e104d96af5cb831b73 |
Notes | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
PQID | 34738565 |
PQPubID | 23500 |
PageCount | 6 |
ParticipantIDs | proquest_miscellaneous_34738565 crossref_primary_10_1016_j_mee_2008_12_068 pascalfrancis_primary_21753615 elsevier_sciencedirect_doi_10_1016_j_mee_2008_12_068 |
PublicationCentury | 2000 |
PublicationDate | 2009-10-01 |
PublicationDateYYYYMMDD | 2009-10-01 |
PublicationDate_xml | – month: 10 year: 2009 text: 2009-10-01 day: 01 |
PublicationDecade | 2000 |
PublicationPlace | Amsterdam |
PublicationPlace_xml | – name: Amsterdam |
PublicationTitle | Microelectronic engineering |
PublicationYear | 2009 |
Publisher | Elsevier B.V Elsevier |
Publisher_xml | – name: Elsevier B.V – name: Elsevier |
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SSID | ssj0016408 |
Score | 2.0195215 |
Snippet | We propose a very large-area ultraviolet imprint lithography process as a promising alternative to expensive conventional optical lithography for the... |
SourceID | proquest crossref pascalfrancis elsevier |
SourceType | Aggregation Database Index Database Publisher |
StartPage | 1983 |
SubjectTerms | Applied sciences Auto release Electronics Exact sciences and technology Hard stamp Microelectronic fabrication (materials and surfaces technology) Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Ultraviolet imprint process Vacuum environment |
Title | Development of a very large-area ultraviolet imprint lithography process |
URI | https://dx.doi.org/10.1016/j.mee.2008.12.068 https://search.proquest.com/docview/34738565 |
Volume | 86 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1LS8QwEB50vSgiPnF9rDl4Euq2zWM3x0WUVcGLCt5K0k5xZV_sdg9e_O1O0lZcFA9eCyHlSzKPzJdvAM4V76CIY03WD7NAoKQzhzwPwtyQg9B5ytGzLR5U_1ncvciXFbiq38I4WmVl-0ub7q119aVdodmeDgbtR0eg1-T-XMyjtJKrsEbuSIgGrPVu7_sPX8UEJXxjOi_x7QbUxU1P8xohloxKdynoBFd_d0-bUzMn0PKy28UPw-290c02bFVhJOuVf7oDKzjehY1v4oJ70P_GB2KTnBlGu_adDR31OzAUK7LFsJgZX5kv2GDkbvgKRlH5a6VizablI4J9eL65frrqB1XfhCDlslsEXAvFKfGzkSJcolB3UaAwXattjFJzHXKb5hlHFWZ0xpEyskwrk8vUdnlkO_wAGuPJGA8d8SlFSnoE5TlchKkyNrcYRzzNjLQZyiZc1HAl01IeI6l5Y28JYVu2uYzihLBtgqgBTZbWOCHz_dew1hL4XxPFTmWUIrImnNWrkdDhcBUPM8bJYp5w4cR6lDz638zHsO6LR567dwKNYrbAU4pBCtuC1cuPqFXttE9t0drm |
link.rule.ids | 315,786,790,4521,24144,27955,27956,45618,45712 |
linkProvider | Elsevier |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV05T8MwFLagDIAQ4hTl9MCEFJrER-sRIVCB0gUqdbPs5EUU9RKkAwu_nWcnqYpADKxRIkef7Xf4ff4eIeeSNYHHsULrB2nAQeCeA5YFYWbQQagsYeDZFl3Z7vH7vugvkevqLoyjVZa2v7Dp3lqXTxolmo3pYNB4cgR6he7PxTxSSbFMVlw04Hhdl59zngemA74tnRf4dq9XpU1P8hoBFHxKdyTo5FZ_d04bU_OOkGVFr4sfZtv7otstslkGkfSq-M9tsgTjHbK-IC24S9oLbCA6yaihuGY_6NARvwODkSKdDfM34-vyOR2M3PleTjEmfyk1rOm0uEKwR3q3N8_X7aDsmhAkTLTygCkuGaZ9NpKIShSqFnDgpmWVjUEopkJmkyxlIMMUdzhgPpYqaTKR2BaLbJPtk9p4MoYDR3tKAFMejlkO42Eijc0sxBFLUiNsCqJOLiq49LQQx9AVa-xVI7ZFk8so1ohtnfAKUP1thjUa778-O_0G_nyg2GmMYjxWJ2fVbGjcGq7eYcYwmb1rxp1UjxSH_xv5jKy2nx87unPXfTgia76M5Fl8x6SWv83gBKOR3J761fYFXKnbuw |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Development+of+a+very+large-area+ultraviolet+imprint+lithography+process&rft.jtitle=Microelectronic+engineering&rft.au=Kim%2C+Ki-don&rft.au=Jeong%2C+Jun-ho&rft.au=Park%2C+Sang-hu&rft.au=Choi%2C+Dae-geun&rft.date=2009-10-01&rft.pub=Elsevier+B.V&rft.issn=0167-9317&rft.eissn=1873-5568&rft.volume=86&rft.issue=10&rft.spage=1983&rft.epage=1988&rft_id=info:doi/10.1016%2Fj.mee.2008.12.068&rft.externalDocID=S0167931708006965 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0167-9317&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0167-9317&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0167-9317&client=summon |