Ellipsometry study of poly( o-methoxyaniline) thin films

• Published in: Thin solid films Vol. 500; no. 1; pp. 252 - 258
• Main Authors: Shrestha, R.P., Yang, D., Irene, E.A.
• Format: Journal Article
• Language: English
• Published: Lausanne Elsevier B.V 03.04.2006; Elsevier Science
• Subjects: AFM; Applied sciences; Cross-disciplinary physics: materials science; rheology; Electrical, magnetic and optical properties; Ellipsometry; Exact sciences and technology; Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids); Materials science; Methods of deposition of films and coatings; film growth and epitaxy; Optical properties; Organic polymers; Physicochemistry of polymers; Physics; Poly( o-methoxyaniline); POMA; Properties and characterization; Thin film; AFM; Poly( o-methoxyaniline); POMA; Optical properties; Ellipsometry; Thin film; Ultrathin films; Atomic force microscopy; Spectroscopic ellipsometry; Optical models; Refractive index; Roughness; Experimental study; Optical anisotropy; Extinction index; Thin films; Thickness; Conducting polymers; Poly(o-methoxyaniline); Ultraviolet visible spectrum; Spin-on coating; Effective medium model; Sol-gel process; Organic compounds; Polyanilines
• ISSN: 0040-6090; 1879-2731
• DOI: 10.1016/j.tsf.2005.11.084

Spin-coated poly( o-methoxyaniline) (POMA) thin films on various substrates were investigated using spectroscopic ellipsometry (SE) in the 1.5–4.5 eV photon energy range. Spin-coating process parameters are reported (spin speed and concentration). Substrates with higher surface energy were found to increase polymer film thickness and decrease roughness. An optical model was developed using SE data along with complementary data from atomic force microscopy and UV–vis spectroscopy to obtain optical properties—refractive index n and extinction coefficient k for POMA. The model includes Lorentz oscillators for the POMA film and a Bruggeman effective medium approximation for roughness. In-plane film optical anisotropy was not observed, but a small out of plane anisotropy was detected for the polymer.