Hydrogen-rich c-Si interfacial modification to obtain efficient passivation for silicon heterojunction solar cell
How to passivate the heterojunction between the doped layer and the crystalline silicon (c-Si) base plays a crucial role for the silicon heterojunction (SHJ) solar cell to obtain high performance, especially high open-circuit voltage ( V OC ) and fill factor (FF). Here, a hydrogen-rich c-Si interfac...
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Published in | Journal of materials science. Materials in electronics Vol. 31; no. 17; pp. 14608 - 14613 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
New York
Springer US
01.09.2020
Springer Nature B.V |
Subjects | |
Online Access | Get full text |
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Summary: | How to passivate the heterojunction between the doped layer and the crystalline silicon (c-Si) base plays a crucial role for the silicon heterojunction (SHJ) solar cell to obtain high performance, especially high open-circuit voltage (
V
OC
) and fill factor (FF). Here, a hydrogen-rich c-Si interfacial modification was realized by preparing an ultrathin (~ 1.5 nm) intrinsic hydrogenated amorphous silicon (a-Si:H) onto the c-Si(n) interface with pure silane via plasma enhanced chemical vapor deposition (PECVD), prior to the deposition of a ~ 8 nm relatively compact a-Si:H(i) layer for the a-Si:H(p)/c-Si(n) heterojunction. The enhanced effective minority carrier lifetime (
τ
eff
) of the c-Si base and
V
OC
of the final solar cell indicated that such interfacial modification improved the heterojunction passivation efficiently by saturating the c-Si dangling bonds (DBs) via hydrogenation with the following deposition of the compact a-Si:H(i) layer that kept the c-Si interface out of direct contact with the doped layer. By altering the deposition pressure, the hydrogen content (
C
H
) in the ultrathin a-Si:H was adjusted regularly to fabricate a series of SHJ solar cells with the area of 244.45 cm
2
. A maximal conversion efficiency up to 23.81% was achieved with
V
OC
of 742.9 mV,
J
SC
of 38.67 mA/cm
2
and FF of 82.99% when the ultrathin a-Si:H had a relatively high
C
H
of about 24–25%. |
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ISSN: | 0957-4522 1573-482X |
DOI: | 10.1007/s10854-020-04023-0 |