Characterisation of AlGaN MSM by Light Beam Induced Current technique

The influence of the grain structure on the performance of AlGaN MSM detector structures was examined by Light Beam Induced Current (LBIC) technique. LBIC is a mapping technique in which the generated photocurrent is measured for each position of the scanning light beam. Estimated values for the eff...

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Published inPhysica status solidi. C Vol. 3; no. 3; pp. 602 - 606
Main Authors Paszkiewicz, Bogdan, Szyszka, Adam, Wosko, Mateusz, Macherzynski, Wojciech, Paszkiewicz, Regina, Tlaczala, Marek
Format Journal Article
LanguageEnglish
Published Berlin WILEY-VCH Verlag 01.03.2006
WILEY‐VCH Verlag
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Summary:The influence of the grain structure on the performance of AlGaN MSM detector structures was examined by Light Beam Induced Current (LBIC) technique. LBIC is a mapping technique in which the generated photocurrent is measured for each position of the scanning light beam. Estimated values for the effective carrier collection regions between contact electrodes in AlGaN MSM structures are hundreds of nanometers. A non‐uniformity of the carrier distribution was observed. Regions, where the measured signal was one order of magnitude larger than the average signal level, were also observed. LBIC method was applied for investigation of layer quality and for optimisation of MSM detectors. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
Bibliography:istex:6E119EA6B82069F130ACE699DC27967EEDC3CDE1
ark:/67375/WNG-3X1RFKWC-8
ArticleID:PSSC200564147
ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:1862-6351
1610-1634
1610-1642
DOI:10.1002/pssc.200564147