High temperature electrical conductivity in ZnSe:In and in CdSe:In under selenium vapor pressure

High temperature electrical conductivity (HTEC) isotherms and isobars of ZnSe:In and of CdSe:In are compared. There are differencies in In‐doping mechanisms of II–VI compounds. When HTEC isotherms and isobars of ZnSe:In and of CdSe:In, measured under metal component vapour pressure give both n‐type...

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Published inPhysica Status Solidi (b) Vol. 244; no. 5; pp. 1623 - 1626
Main Authors Lott, K., Shinkarenko, S., Volobujeva, O., Türn, L., Nirk, T., Öpik, A., Nisumaa, R., Kallavus, U., Nõges, M., Mikli, V., Viljus, M., Gorokhova, E., Anan'eva, G., Grebennik, A., Vishnjakov, A.
Format Journal Article
LanguageEnglish
Published Berlin WILEY-VCH Verlag 01.05.2007
WILEY‐VCH Verlag
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Summary:High temperature electrical conductivity (HTEC) isotherms and isobars of ZnSe:In and of CdSe:In are compared. There are differencies in In‐doping mechanisms of II–VI compounds. When HTEC isotherms and isobars of ZnSe:In and of CdSe:In, measured under metal component vapour pressure give both n‐type conductivity then differences appear in the results of measurements under the selenium vapor pressure (p Se 2). ZnSe:In isotherms in the last case are characterized by the conductivity type conversion but no such drastic change of HTEC type is observed on CdSe:In isotherms. Under the conditions of p Se 2, the activation energy of HTEC isobars for ZnSe:In is ΔE ≈ 1.3–1.6 eV and for CdSe:In is ΔE ≈ 1.2 eV. The onefold ionized substitutional In at Zn place is proposed to be compensated by native defects in ZnS:In and in CdSe:In under high p Se 2. This native defect may be onefold ionized zinc vacancy for ZnSe:In and twofold ionized cadmium vacancy for CdSe:In. Association of defects occur at lower temperatures. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
Bibliography:ArticleID:PSSB200675117
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istex:439C0A32967453DE6F54DA21E480554214C53B6B
ESF - No. G5156; No. G5891; No. G5917; No. G5875
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ObjectType-Conference Paper-1
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ISSN:0370-1972
1521-3951
DOI:10.1002/pssb.200675117