Isothermal aging of near-eutectic Sn-Ag-Cu solder alloys and its effect on electrical resistivity
Solder joints were prepared from seven eutectic and near-eutectic Sn-based compositions and characterized for electrical resistivity after 100 h and 1,000 h of isothermal aging at 423 K. The solder joint samples were prepared by hand soldering to copper substrates, and the post-heat treatment resist...
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Published in | Journal of electronic materials Vol. 32; no. 12; pp. 1384 - 1391 |
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Main Authors | , , , |
Format | Conference Proceeding Journal Article |
Language | English |
Published |
New York, NY
Institute of Electrical and Electronics Engineers
01.12.2003
Springer Nature B.V |
Subjects | |
Online Access | Get full text |
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Summary: | Solder joints were prepared from seven eutectic and near-eutectic Sn-based compositions and characterized for electrical resistivity after 100 h and 1,000 h of isothermal aging at 423 K. The solder joint samples were prepared by hand soldering to copper substrates, and the post-heat treatment resistivity was measured at room temperature in a specially designed, four-point probe fixture. Compositions tested included Sn-3.5Ag, Sn-3.7Ag-0.9Cu, Sn-3.OAg0.5Cu, Sn-3.6Ag-1.0Cu, and Sn-3.9Ag-0.6Cu. In addition, the effect of a minor addition of a fourth element, designed to improve high-temperature shear strength, was also evaluated in the compositions Sn-3.7Ag-0.6Cu-0.3Co and Sn-3.7Ag-0.7Cu-0.2Fe. The observed changes in electrical resistivity are discussed in terms of microstructural coarsening, diffusional transport from the substrate, and nucleation of precipitate phases. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 W-7405-Eng-82 IS-J 6912 USDOE Office of Science (SC) |
ISSN: | 0361-5235 1543-186X |
DOI: | 10.1007/s11664-003-0105-3 |