On-chip Mach-Zehnder-like interferometer for atomic spin precession detection

• Published in: IEEE photonics journal Vol. 15; no. 3; pp. 1 - 9
• Main Authors: Cui, Zhibo, Zhou, Xiangyang, Bai, Dongbi, Wang, Weiyi, Chai, Zhen
• Format: Journal Article
• Language: English
• Published: Piscataway IEEE 01.06.2023; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Atom optics; Atomic measurements; atomic spin precession detection; Interferometers; LF noise; Linear polarization; Mach-Zehnder-like interferometer; On-chip; Optical components; Optical interferometry; Optical polarization; Optical properties; Optical rotation; Optical sensors; Optical waveguides; phase modulation; polarization sorter; Precession; Sensitivity; Silicon; Waveguides
• ISSN: 1943-0655; 1943-0647
• DOI: 10.1109/JPHOT.2023.3262309

At present, most atomic spin precession detection schemes use discrete optical elements, which leads to bulky detection systems. However, chip-based spin precession detection schemes lack modulation, resulting in lower detection sensitivity. In this paper, we propose and simulatively demonstrate an integrated atomic spin precession detection scheme using an on-chip Mach-Zehnder-like interferometer. An on-chip polarization sorter is designed, with contrast ratio of 24dB and coupling efficiency of 16.8% at 795 nm. With this device, linearly polarized probe light that experienced optical rotation can be split and coupled into two waveguide arms of the interferometer. To avoid the effect of low frequency noise, our scheme uses a micro-heater to modulate the phase difference signal, allowing for high sensitivity detection. The whole detection system can reach micron size, which provides a practical new technique for high precision atomic sensors that can be integrated into chips.