Initial Tests and Characterization of the Readout Electronics for the IXPE Mission
Due to be launched in late 2021, the imaging X-ray polarimetry explorer (IXPE) is a NASA Small Explorer mission designed to perform polarization measurements in the 2-8-keV band, complemented with imaging, spectroscopy, and timing capabilities. At the heart of the focal plane, there are a set of thr...
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Published in | IEEE transactions on nuclear science Vol. 68; no. 5; pp. 1144 - 1151 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.05.2021
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
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Summary: | Due to be launched in late 2021, the imaging X-ray polarimetry explorer (IXPE) is a NASA Small Explorer mission designed to perform polarization measurements in the 2-8-keV band, complemented with imaging, spectroscopy, and timing capabilities. At the heart of the focal plane, there are a set of three polarization-sensitive gas pixel detectors, each based on a custom-integrated circuit acting as a charge-collecting anode, with their readout electronics. We designed an integrated test equipment based on the VMEbus protocol to characterize the performance of such detectors, debug the IXPE readout electronics, and perform stable data acquisitions to study the whole system. The test campaign was conducted to validate the readout processor against the mission requirements in more demanding conditions than the worst case foreseen for in-orbit operations. The test showed that the device under test could sustain an event rate with a 5.9-keV source, nearly twice the worst case of 300 Hz at 3 keV, with a dead time down to 1.1 ms. Additionally, we performed various scans in the readout electronics parameter space to optimize its performance in observing celestial sources. The success of the test campaign proved the robustness and reliability of the system in these conditions, legitimating its adoption for the IXPE mission. |
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ISSN: | 0018-9499 1558-1578 |
DOI: | 10.1109/TNS.2021.3073662 |