Investigation of Layer Structure of MHPOBC Free-Standing Film by Transmission Ellipsometry

Thin MHPOBC Free-Standing Film (FSF) was investigated by transmission ellipsometry. It was found that the temperature at which the remarkable change of δ occurs increases with decreasing the layer number, and some of the subphase disappeared in case of thin FSF. The layer thickness of thin FSF was 2...

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Published inMolecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals Vol. 365; no. 1; pp. 835 - 844
Main Authors Okumoto, Yoshitaka, Kimura, Munehiro, Akahane, Tadashi, Masuhashi, Nobuaki
Format Journal Article Conference Proceeding
LanguageEnglish
Published Philadelphia, PA Taylor & Francis Group 01.07.2001
Gordon and Breach
Subjects
antiferroelectric liquid crystal
Condensed matter: structure, mechanical and thermal properties
ellipsometry
Exact sciences and technology
Experimental determinations of smectic, nematic, cholesteric, and other structures
free standing Film
Liquid crystals
Liquid thin films
Physics
Structure of solids and liquids; crystallography
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
Lamellar structure
Optical transmission
Diester
Benzenic compound
Antiferroelectric materials
Mesomorphic state structure
Experimental study
Liquid crystals
Organic compounds
Ellipsometry
Liquid thin film
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Summary:Thin MHPOBC Free-Standing Film (FSF) was investigated by transmission ellipsometry. It was found that the temperature at which the remarkable change of δ occurs increases with decreasing the layer number, and some of the subphase disappeared in case of thin FSF. The layer thickness of thin FSF was 2.5 nm which is shorter than the molecular length, and was not depend on the tilt angle.
ISSN:1058-725X
DOI:10.1080/10587250108025362