APA (7th ed.) Citation

Kim, M., Lee, H., & Kim, C. (2012). PVT Variation Tolerant Current Source With On-Chip Digital Self-Calibration. IEEE transactions on very large scale integration (VLSI) systems, 20(4), 737-741. https://doi.org/10.1109/TVLSI.2011.2109971

Chicago Style (17th ed.) Citation

Kim, Moo-Young, Hokyu Lee, and Chulwoo Kim. "PVT Variation Tolerant Current Source With On-Chip Digital Self-Calibration." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 20, no. 4 (2012): 737-741. https://doi.org/10.1109/TVLSI.2011.2109971.

MLA (9th ed.) Citation

Kim, Moo-Young, et al. "PVT Variation Tolerant Current Source With On-Chip Digital Self-Calibration." IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 20, no. 4, 2012, pp. 737-741, https://doi.org/10.1109/TVLSI.2011.2109971.