Energy Storage Performance of PZT/PZ Composite Films Obtained by Sol–Gel Method

• Published in: Physica status solidi. A, Applications and materials science Vol. 220; no. 17
• Main Authors: Yang, Fei, Yuan, Zheng, Wu, ShuJing, Chen, Jingyao, Hou, Mengzhe, Liu, Andi, Yu, Kexin, Zhang, Yihan, Li, Xiaofang, Hu, Yanchun, Shang, Jun, Yin, Shaoqian, Wang, Xianwei
• Format: Journal Article
• Language: English
• Published: Weinheim Wiley Subscription Services, Inc 01.09.2023
• Subjects: Annealing; composite films; Crystal structure; Energy storage; Hysteresis loops; Lead zirconate titanates; Multilayers; Perovskites; phase composition; Silicon dioxide; Silicon substrates; Sol-gel processes; Solid phases; sol–gel method
• ISSN: 1862-6300; 1862-6319
• DOI: 10.1002/pssa.202300233

PbZr0.52Ti0.48O3(PZT)/PbZrO3(PZ) composite films are deposited on LaNiO3/SiO2/Si substrates using sol–gel method, and annealed at 620 °C for a different time with the rapid thermal annealing technology. The microstructures, crystal structure, and electrical performance of the PZT/PZ composite films are researched. When the composite films are annealed at 620 °C for 3 min, the PZT films show the perovskite phase and the PZ films exhibit the pyrochlore phase with tiny perovskite phase, making the films obtain a linear hysteresis loop and possess the high energy storage density of 10.0 J cm−3 and the energy storage efficiency of 84.8%. The aforementioned experimental results show that the phase structure of the PZT/PZ multilayer films can be regulated by different annealing times, which would improve the energy storage performance. Herein, the phase structure of the PZT/PZ multilayer films can be regulated by different annealing times, enhancing the energy storage performance. The experimental results indicate that the PZT/PZ composite films annealed at 620 °C for 3 min possess a high energy storage density of 10.0 J cm−3 and an energy storage efficiency of 84.8%.