Controlling liquid crystal boojum defects on fixed microparticle arrays via capillarity-assisted particles assembly

• Published in: Journal of colloid and interface science Vol. 645; pp. 115 - 121
• Main Authors: Yun, Hee Seong, Meijs, Zazo Cazimir, Park, Geonhyeong, Fu, Yutong, Isa, Lucio, Yoon, Dong Ki
• Format: Journal Article
• Language: English
• Published: United States Elsevier Inc 01.09.2023
• Subjects: Boojum defects; Capillarity-assisted particle assembly; Liquid crystals; Microparticles; Topological defects; CAPA; Capillarity-assisted particle assembly; Topological defects; Boojum defects; LC; 8CB; PI; Liquid crystals; Microparticles; PAPI; POM; PDMS
• ISSN: 0021-9797; 1095-7103
• DOI: 10.1016/j.jcis.2023.04.100

[Display omitted] Colloidal particles in nematic liquid crystals (LCs) are of high interest for self-assembly of soft matter systems. When two free particles approach within a uniaxially-oriented nematic LC, an elastic force is generated due to the distorted nematic director configuration around them, allowing particles to self-assemble by an attractive force. We hypothesize that if particles are immobilized, repulsive forces emerge instead, causing the deflection of the interacting defects to compensate for the energy increase. We fabricated tailored arrays of spherical silica microparticles via capillarity-assisted particle assembly (CAPA) to investigate the interactions of defects as a function of particle separation. By transferring the particle arrays from the CAPA templates to a glass substrate, we studied interacting boojum defect textures within thin LC films sandwiched between two substrates using polarized optical microscopy (POM). We observed deflected boojum defects on arrays of fixed silica particles, confirming our hypothesis that the elastic repulsive force between the particles affects the defect orientation. The nematic director configuration is reconstructed by Landau-de Gennes q-tensor modeling, and simulated POM images are obtained by the Jones-Matrix method. Our results provide a new platform for controlling defect interactions and pave the way for future work to study topology and implement new defect based applications in LC films.