Thickness and Refractive Index Measurements by Full-Field Optical Coherence Microscopy

We present the noble sensing method that can simultaneously measure the physical thickness and the refractive index of a transparent specimen based on full-field optical coherence microscopy. As a sample, a small drop of epoxy was placed on a flat glass plate and high-resolution depth resolved en-fa...

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Bibliographic Details
Published inIEEE sensors journal Vol. 9; no. 12; pp. 1996 - 1997
Main Authors Jihoon Na, Choi, W.J., Hae Young Choi, Seon Young Ryu, Eun Seo Choi, Byeong Ha Lee
Format Journal Article
LanguageEnglish
Published New York IEEE 01.12.2009
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Biomedical optical imaging
Coherence
Cross sections
Full-field optical coherence microscopy (FF-OCM)
Glass
medical imaging equipment
Microscopy
Nonlinear optics
Optical films
Optical interferometry
Optical microscopy
Optical refraction
Optical sensors
Optical variables control
Planes
Refractive index
refractive index measurement
Refractivity
Thickness measurement
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Summary:We present the noble sensing method that can simultaneously measure the physical thickness and the refractive index of a transparent specimen based on full-field optical coherence microscopy. As a sample, a small drop of epoxy was placed on a flat glass plate and high-resolution depth resolved en-face images were taken. With adopting the reference plane from a cross-sectional image, the physical thickness, and the refractive index distribution could be obtained.
Bibliography:ObjectType-Article-2
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content type line 23
ISSN:1530-437X
1558-1748
DOI:10.1109/JSEN.2009.2031808