Synthesis and characterization of spinel ferrites for microwave devices

The prepared ferrite system with chemical formula Mg 0.6 Li 0.4 Yb x Fe 2−x O 4 ; x  = 0.00 and 0.1 having valuable magnetic and electrical properties. The X-ray diffraction data confirmed the cubic spinel structure with single phase. The one order increase in magnitude of dc resistivity was found w...

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Bibliographic Details
Published inJournal of sol-gel science and technology Vol. 97; no. 3; pp. 593 - 599
Main Authors Qindeel, Rabia, Alonizan, Norah H., Alghamdi, Eman A., Awad, Manal A.
Format Journal Article
LanguageEnglish
Published New York Springer US 01.03.2021
Springer Nature B.V
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Summary:The prepared ferrite system with chemical formula Mg 0.6 Li 0.4 Yb x Fe 2−x O 4 ; x  = 0.00 and 0.1 having valuable magnetic and electrical properties. The X-ray diffraction data confirmed the cubic spinel structure with single phase. The one order increase in magnitude of dc resistivity was found with ‘Yb’ substitution as compared to Mg–Li based ferrites. The room temperature dielectric loss under the frequency of 3 GHz was 3 × 10 −3 . By using better stoichiometric ratio, size and the nature of substituted element, one can achieve suitable combination of low dielectric loss and high resistivity. In present work, the dielectric study (as a function of frequency) was done in frequency range of 0.1–20 MHz at different temperatures. The magnetic properties were measured up to applied field of 2 KOe. The low values of dielectric loss and high value of dc resistivity suggested that prepared samples may be suitable for microwave devices. Highlights The single phase spinel ferrite having formula Mg 0.6 Li 0.4 Yb x Fe 2−x O 4 ; x = 0.00 and 0.1 prepared by conventional ceramic technique. The average size of particle was measured by using FWHM of intense peak (311) and using Scherer equation. The decrease in dc resistivity with upturn of temperature confirmed semiconductor nature prepared sample. This material may be used microwave devices due to their low dielectric loss and dielectric constant.
ISSN:0928-0707
1573-4846
DOI:10.1007/s10971-021-05470-9