Shape evolution of high aspect ratio holes on Si(001) during hydrogen annealing
We study the dynamics of void formation through the shape evolution of high-aspect-ratio cylindrical holes in Si(001) substrates under hydrogen annealing. We compare the observed evolution of these holes with numerical simulations based on the continuum theory for surface-diffusion-driven shape evol...
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Published in | Journal of applied physics Vol. 114; no. 18 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Melville
American Institute of Physics
14.11.2013
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ISSN | 0021-8979 1089-7550 |
DOI | 10.1063/1.4829912 |
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Abstract | We study the dynamics of void formation through the shape evolution of high-aspect-ratio cylindrical holes in Si(001) substrates under hydrogen annealing. We compare the observed evolution of these holes with numerical simulations based on the continuum theory for surface-diffusion-driven shape evolution. We find that a strong morphological instability arises near the hole opening, regardless of the presence of anisotropy in surface energy. The observed shape evolution of high-aspect-ratio holes during hydrogen annealing is understood as a surface-diffusion-driven evolution subject to the stability of the facets which form the vertical sidewall. |
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AbstractList | We study the dynamics of void formation through the shape evolution of high-aspect-ratio cylindrical holes in Si(001) substrates under hydrogen annealing. We compare the observed evolution of these holes with numerical simulations based on the continuum theory for surface-diffusion-driven shape evolution. We find that a strong morphological instability arises near the hole opening, regardless of the presence of anisotropy in surface energy. The observed shape evolution of high-aspect-ratio holes during hydrogen annealing is understood as a surface-diffusion-driven evolution subject to the stability of the facets which form the vertical sidewall. |
Author | Kuribayashi, H. Hiruta, R. Sudoh, K. |
Author_xml | – sequence: 1 givenname: K. surname: Sudoh fullname: Sudoh, K. – sequence: 2 givenname: R. surname: Hiruta fullname: Hiruta, R. – sequence: 3 givenname: H. surname: Kuribayashi fullname: Kuribayashi, H. |
BookMark | eNptkMtuwjAQRa2qlQq0i_6BpW5gEfA4zsPLCvUlIbGgXVtDMpCgYFM7qcTfNwhWqKuR7pw7jztkt9ZZYuwJxBREGs9gqnKpNcgbNgCR6yhLEnHLBkJIiHKd6Xs2DGEnBEAe6wFbrio8EKdf13Rt7Sx3G17V24pjOFDRco-9yivXUOB9d1WPe-uEl52v7ZZXx9K7LVmO1hI2vfTA7jbYBHq81BH7fnv9mn9Ei-X75_xlERVxkrZRKpGwWKNIUCIg6UwmSaaSUupESIEStMpKoRQCFGoNmValIC1KonUZ50U8YuPz3IN3Px2F1uzrUFDToCXXBQNpBqnIZZb26PMVunOdt_11RsJpn0rTvKdmZ6rwLgRPG1PU7el523qsGwPCnAI2YC4B947JlePg6z364z_sHzMAehU |
CitedBy_id | crossref_primary_10_1149_2_0331606jss crossref_primary_10_1088_2631_7990_ad492e crossref_primary_10_1002_tee_23747 crossref_primary_10_1016_j_joule_2019_05_013 crossref_primary_10_1021_acsami_6b05261 crossref_primary_10_1016_j_jcp_2018_10_006 crossref_primary_10_1016_j_mtcomm_2021_103119 crossref_primary_10_1093_jmicro_dfz108 crossref_primary_10_1088_1674_4926_39_7_071005 crossref_primary_10_1088_0957_4484_26_35_355707 crossref_primary_10_1088_0256_307X_33_12_126801 crossref_primary_10_1364_OE_23_009979 crossref_primary_10_1016_j_jeurceramsoc_2019_01_001 |
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ContentType | Journal Article |
Copyright | 2013 AIP Publishing LLC. |
Copyright_xml | – notice: 2013 AIP Publishing LLC. |
DBID | AAYXX CITATION 8FD H8D L7M 7U5 |
DOI | 10.1063/1.4829912 |
DatabaseName | CrossRef Technology Research Database Aerospace Database Advanced Technologies Database with Aerospace Solid State and Superconductivity Abstracts |
DatabaseTitle | CrossRef Technology Research Database Aerospace Database Advanced Technologies Database with Aerospace Solid State and Superconductivity Abstracts |
DatabaseTitleList | CrossRef Aerospace Database Technology Research Database |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Physics |
EISSN | 1089-7550 |
ExternalDocumentID | 10_1063_1_4829912 |
GroupedDBID | -DZ -~X .DC 1UP 2-P 29J 4.4 53G 5GY 5VS 85S AAAAW AABDS AAGWI AAIKC AAMNW AAPUP AAYIH AAYXX ABFTF ABJGX ABJNI ABRJW ABZEH ACBEA ACBRY ACGFO ACGFS ACLYJ ACNCT ACZLF ADCTM ADMLS AEGXH AEJMO AENEX AFATG AFHCQ AGKCL AGLKD AGMXG AGTJO AHSDT AIAGR AIDUJ AJJCW AJQPL ALEPV ALMA_UNASSIGNED_HOLDINGS AQWKA ATXIE AWQPM BDMKI BPZLN CITATION CS3 D0L DU5 EBS EJD F5P FDOHQ FFFMQ HAM M6X M71 M73 N9A NPSNA O-B P0- P2P RIP RNS ROL RQS RXW SC5 TAE TN5 TWZ UHB UPT WH7 XSW YQT YZZ ZCA ~02 8FD H8D L7M 7U5 |
ID | FETCH-LOGICAL-c356t-62aeacba05a2a1ae97255745d295020a21947d044a11c4b1794d0e90deebd38c3 |
ISSN | 0021-8979 |
IngestDate | Fri Sep 05 11:57:04 EDT 2025 Sun Jun 29 16:16:47 EDT 2025 Tue Jul 01 03:49:03 EDT 2025 Thu Apr 24 23:10:10 EDT 2025 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 18 |
Language | English |
LinkModel | OpenURL |
MergedId | FETCHMERGED-LOGICAL-c356t-62aeacba05a2a1ae97255745d295020a21947d044a11c4b1794d0e90deebd38c3 |
Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 content type line 23 |
PQID | 2129504668 |
PQPubID | 2050677 |
ParticipantIDs | proquest_miscellaneous_1671608276 proquest_journals_2129504668 crossref_citationtrail_10_1063_1_4829912 crossref_primary_10_1063_1_4829912 |
ProviderPackageCode | CITATION AAYXX |
PublicationCentury | 2000 |
PublicationDate | 2013-11-14 |
PublicationDateYYYYMMDD | 2013-11-14 |
PublicationDate_xml | – month: 11 year: 2013 text: 2013-11-14 day: 14 |
PublicationDecade | 2010 |
PublicationPlace | Melville |
PublicationPlace_xml | – name: Melville |
PublicationTitle | Journal of applied physics |
PublicationYear | 2013 |
Publisher | American Institute of Physics |
Publisher_xml | – name: American Institute of Physics |
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SSID | ssj0011839 |
Score | 2.1816456 |
Snippet | We study the dynamics of void formation through the shape evolution of high-aspect-ratio cylindrical holes in Si(001) substrates under hydrogen annealing. We... |
SourceID | proquest crossref |
SourceType | Aggregation Database Enrichment Source Index Database |
SubjectTerms | Anisotropy Annealing Applied physics Computer simulation Continuums Dynamic tests Evolution High aspect ratio Hydrogen Instability Silicon substrates Stability Surface energy Surface stability |
Title | Shape evolution of high aspect ratio holes on Si(001) during hydrogen annealing |
URI | https://www.proquest.com/docview/2129504668 https://www.proquest.com/docview/1671608276 |
Volume | 114 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3ba9UwGA_HDUEfRKfimVOi-DAprb2kSfMiDC8MdSp0g72VpEmZME7H2elg_vV-uTTnHM8epi-lpJeE_Nrv--W7BaE3QBG4kF0ZZ0orU1S7jUXa5XHaFVR0TFCuTe7w0Xd6eEK-nJank8n7lailYSGT9veNeSX_gyq0Aa4mS_YfkA0vhQY4B3zhCAjD8VYY12fiQkf6yndiiR8stiNh8ycjC25kNsC1PoEaeqpsyXw-ZieeXat5D6-PBIhbcT6qsU2yKjxZdYaQwMPrQfXWLvM1Wdqw54NnpKHN-ImkuDb7NllVl6zaGrLCJN25HM8Q-5_FFXfbvyTaicy04jErXfnYIFOXTw2jhN0Q1sCOjN0gIRXoRB9MvVYQ-y9FFcIHreOcFk3W-EfvoO2cMeOm3z74ePStDn4kw_9ckI8b91hbihbvQr_rjGRdIVuWcfwQPfAzjg8c1o_QRM920P2VopE76O5Ph8Fj9MPijwP-uO-wwR87_LHFH1v8MVytf-3DWN9ihz0esccB-yfo5POn4w-Hsd8gI26Lki5imgvQm1KkpchFJjRnsEBkpFQ5L2EZIEAbEaZSQkSWtUQa2atSzVOltVRF1RZP0dasn-lnCItSAhHvtGQdJ4S3XKiuJV0mS6aVJHyK9sdJalpfPd5sYnLebIAxRa_DrReuZMpNN-2NM934P-qyARoFAyeUVlP0KlwGeWecWGKm--GyySjgDLyV0d3b9PMc3Vt-yHtoazEf9AugkQv50n8rfwD5sG9T |
linkProvider | EBSCOhost |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Shape+evolution+of+high+aspect+ratio+holes+on+Si%28001%29+during+hydrogen+annealing&rft.jtitle=Journal+of+applied+physics&rft.au=Sudoh%2C+K.&rft.au=Hiruta%2C+R.&rft.au=Kuribayashi%2C+H.&rft.date=2013-11-14&rft.issn=0021-8979&rft.eissn=1089-7550&rft.volume=114&rft.issue=18&rft_id=info:doi/10.1063%2F1.4829912&rft.externalDBID=n%2Fa&rft.externalDocID=10_1063_1_4829912 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0021-8979&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0021-8979&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0021-8979&client=summon |