X-ray nano computerised tomography of SOFC electrodes using a focused ion beam sample-preparation technique

• Published in: Journal of the European Ceramic Society Vol. 30; no. 8; pp. 1809 - 1814
• Main Authors: Shearing, P.R., Gelb, J., Brandon, N.P.
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 01.06.2010
• Subjects: Electrodes; Focused ion beam; Fuel cells; Ion beams; Microstructure; Nanocomposites; Nanomaterials; Nanostructure; SOFC; Solid oxide fuel cells; Tomography; X-ray methods; X-rays; Microstructure; X-ray methods; Fuel cells; Focused ion beam; SOFC
• ISSN: 0955-2219; 1873-619X
• DOI: 10.1016/j.jeurceramsoc.2010.02.004

High-resolution tomography techniques have facilitated an improved understanding of solid oxide fuel cell (SOFC) electrode microstructures. The use of X-ray nano computerised tomography (nano-CT) imposes some geometrical constraints on the sample under investigation; in this paper, we present the development of an advanced preparation technique to optimise sample geometries for X-ray nano-CT, utilizing a focused ion beam (FIB) system to shape the sample according to the X-ray field of view at the required magnification. The technique has been successfully applied to a Ni-YSZ electrode material: X-ray nano-CT has been conducted at varying length scales and is shown to provide good agreement; comparison of results from X-ray and more conventional FIB tomography is also demonstrated to be favourable. Tomographic reconstructions of SOFC electrodes with volumes spanning two orders of magnitude are presented.