Vertical gradient solution growth of N-type Si0.73Ge0.27 bulk crystals with homogeneous composition and its thermoelectric properties

Compositionally homogeneous Sb-doped (5×1018 and 1×1019cm−3) Si0.73Ge0.27 bulk crystals were grown by a vertical gradient solution growth method. The sandwich sample Si (seed)/Sb-doped Ge/ Si(feed) was set up inside a furnace under a mild temperature gradient 0.57°C/mm for homogeneous growth. The Si...

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Bibliographic Details
Published inJournal of crystal growth Vol. 442; pp. 102 - 109
Main Authors Omprakash, M., Arivanandhan, M., Sabarinathan, M., Koyama, T., Momose, Y., Ikeda, H., Tatsuoka, H., Aswal, D.K., Bhattacharya, S., Inatomi, Y., Hayakawa, Y.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 15.05.2016
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Summary:Compositionally homogeneous Sb-doped (5×1018 and 1×1019cm−3) Si0.73Ge0.27 bulk crystals were grown by a vertical gradient solution growth method. The sandwich sample Si (seed)/Sb-doped Ge/ Si(feed) was set up inside a furnace under a mild temperature gradient 0.57°C/mm for homogeneous growth. The Si composition was analyzed by electron probe micro- analysis (EPMA). It revealed that the Si composition was homogeneous and the lengths of the Sb-doped (5×1018 and 1×1019cm−3) Si0.73Ge0.27 bulk crystals were 18.3 and 15.1mm, respectively. Grain distribution was investigated by electron backscattered diffraction spectrum (EBSD). The Seebeck coefficients (−440 and −426μV/K) of Sb-doped (5×1018 and 1×1019cm−3) Si0.73Ge0.27 were higher than the reported value (−211μV/K) of P-doped (5×1019cm−3) Si0.8Ge0.2 at room temperature. Thermal conductivity of Ga and Sb-doped SiGe was decreased with temperature due to scattering of phonon at the temperature range between 313 and 913K. The maximum ZT values of Ga and Sb-doped SiGe were 0.34 and 0.44 at 820K, respectively. The ZT values of Ga and Sb-doped SiGe were higher (0.07 and 0.13) than the reported value of Ga-doped Si0.81Ge0.19 (0.05) and P-doped (5×1019cm−3) Si0.8Ge0.2 bulk crystals at room temperature. The improvement in ZT value was caused by a decrease of thermal conductivity which related to a composition of the alloy and doping concentration in the crystal. •Compositionally homogeneous Sb-doped SiGe bulk crystals were grown.•The Seebeck coefficients were higher than the reported value of P-doped SiGe bulk.•The ZT value was higher than the reported value of P-doped SiGe bulk.
ISSN:0022-0248
1873-5002
DOI:10.1016/j.jcrysgro.2016.02.025