Phonons in Wurtzite Aluminum Nitride

We present data obtained with inelastic X‐ray scattering measurements of the phonon dispersions in hexagonal aluminum nitride along all three high‐symmetry directions. These are the first such data for AlN. Presently available single crystals are large enough to perform an inelastic X‐ray scattering...

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Bibliographic Details
Published inphysica status solidi (b) Vol. 215; no. 1; pp. 177 - 180
Main Authors Schwoerer-Böhning, M., Macrander, A. T., Pabst, M., Pavone, P.
Format Journal Article
LanguageEnglish
Published Berlin WILEY-VCH Verlag 01.09.1999
WILEY‐VCH Verlag
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Summary:We present data obtained with inelastic X‐ray scattering measurements of the phonon dispersions in hexagonal aluminum nitride along all three high‐symmetry directions. These are the first such data for AlN. Presently available single crystals are large enough to perform an inelastic X‐ray scattering experiment. The results are compared with first‐principles calculations. We find excellent agreement between the data and the calculations.
Bibliography:istex:1A830F95F83CB5ECAA6BCC2A762DAFEAD3201FE2
ark:/67375/WNG-06RM4JBZ-7
ArticleID:PSSB177
ISSN:0370-1972
1521-3951
DOI:10.1002/(SICI)1521-3951(199909)215:1<177::AID-PSSB177>3.0.CO;2-8