A High Slew-Rate Push-Pull Output Amplifier for Low-Quiescent Current Low-Dropout Regulators With Transient-Response Improvement
A high slew-rate amplifier with push-pull output driving capability is proposed to enable an ultra-low quiescent current (Iq ~ 1muA) low-dropout (LDO) regulator with improved transient responses. The proposed amplifier eliminates the tradeoff between small Iq and large slew-rate that is imposed by t...
Saved in:
Published in | IEEE transactions on circuits and systems. II, Express briefs Vol. 54; no. 9; pp. 755 - 759 |
---|---|
Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.09.2007
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | A high slew-rate amplifier with push-pull output driving capability is proposed to enable an ultra-low quiescent current (Iq ~ 1muA) low-dropout (LDO) regulator with improved transient responses. The proposed amplifier eliminates the tradeoff between small Iq and large slew-rate that is imposed by the tail-current in conventional amplifier design. Push-pull output stage is introduced to enhance the output driving ability. Small dropout voltage (Vbo) with large-size pass transistor and ultra-low Iq can thus be used to minimize power loss of LDO regulator without transient-response degradation. The proposed amplifier helps to improve stability of LDO regulators without using any on-chip and off-chip compensation capacitors. This is beneficial to chip-level power management requiring high-area efficiency. An LDO regulator with the proposed amplifier has been implemented in a 0.18- mum standard CMOS process and occupies 0.09 mm 2 . The LDO regulator can deliver 50-mA load current at 1-V input and ~ 100-mV V DO . It only consumes 1.2 muA Iq and is able to recover within ~ 4 mus even under the worst case scenario. |
---|---|
Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 1549-7747 1558-3791 |
DOI: | 10.1109/TCSII.2007.900347 |