Subsurface Characterization using Geophysical Seismic Refraction Survey for Slope Stabilization Design with Soil Nailing

• Published in: Journal of physics. Conference series Vol. 995; no. 1; pp. 12107 - 12114
• Main Authors: Mohamad Ismail, Mohd Ashraf, Ng, Soon Min, Zainal Abidin, Mohd Hazreek, Madun, Aziman
• Format: Journal Article
• Language: English
• Published: Bristol IOP Publishing 01.04.2018
• Subjects: Boreholes; Geophysics; Physics; Refraction; Seismic stability; Seismic surveys; Slope stability; Slope stabilization; Soil layers; Soil nailing; Soil stability; Soil stabilization; Tensile stress; Velocity distribution
• ISSN: 1742-6588; 1742-6596
• DOI: 10.1088/1742-6596/995/1/012107

The application of geophysical seismic refraction for slope stabilization design using soil nailing method was demonstrated in this study. The potential weak layer of the study area is first identify prior to determining the appropriate length and location of the soil nail. A total of 7 seismic refraction survey lines were conducted at the study area with standard procedures. The refraction data were then analyzed by using the Pickwin and Plotrefa computer software package to obtain the seismic velocity profiles distribution. These results were correlated with the complementary borehole data to interpret the subsurface profile of the study area. It has been identified that layer 1 to 3 is the potential weak zone susceptible to slope failure. Hence, soil nails should be installed to transfer the tensile load from the less stable layer 3 to the more stable layer 4. The soil-nail interaction will provide a reinforcing action to the soil mass thereby increasing the stability of the slope.