Modulation reorientation in 10M Ni–Mn–Ga martensite

Synchrotron X-ray diffraction experiments were performed to investigate modulation reorientation by an external stress in a 10M Ni–Mn–Ga single crystal. The initial crystal, with a single c-axis, exhibited two modulation directions, indicating {100) compound twins. Due to monoclinic distortion of th...

Full description

Saved in:
Bibliographic Details
Published inScripta materialia Vol. 68; no. 9; pp. 671 - 674
Main Authors Chulist, R., Straka, L., Sozinov, A., Lippmann, T., Skrotzki, W.
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 01.05.2013
Subjects
Compression test
Ferromagnetic shape memory alloy
Modulation
Synchrotron radiation
Ferromagnetic shape memory alloy
Compression test
Modulation
Synchrotron radiation
Online AccessGet full text

Cover

More Information
Summary:Synchrotron X-ray diffraction experiments were performed to investigate modulation reorientation by an external stress in a 10M Ni–Mn–Ga single crystal. The initial crystal, with a single c-axis, exhibited two modulation directions, indicating {100) compound twins. Due to monoclinic distortion of the pseudo-tetragonal lattice, a compression along 〈110] with constraint on the c-axis resulted in a single modulation along the stress axis, i.e. the elimination of {100) compound twins. Subsequent perpendicular compression reoriented the modulation towards the new loading axis.
ISSN:1359-6462
1872-8456
DOI:10.1016/j.scriptamat.2013.01.024