Planarization of Discrete Track Recording Media to Improve Flyability of Magnetic Recording Sliders

• Published in: IEEE transactions on magnetics Vol. 45; no. 10; pp. 3527 - 3530
• Main Authors: Yoon, Y., Choi, C., Oh, Y., Hong, D., Jin, S., Talke, F.E.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: New York, NY IEEE 01.10.2009; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Atomic force microscopy; Atomic measurements; Cross-disciplinary physics: materials science; rheology; Density; Discrete track recording (DTR); Disk recording; Disks; Exact sciences and technology; Force measurement; Grooves; Hard disks; head-disk interface; Hydrogen; Magnetic materials; Magnetic recording; Magnetism; Materials science; Media; Other topics in materials science; patterned media; Physics; Planarization; Scanning electron microscopy; Sliders; Head disk interface; planarization; head-disk interface; Disks; Recording material; Discrete track recording (DTR); Magnetic recording; Magnetic properties; patterned media
• ISSN: 0018-9464; 1941-0069
• DOI: 10.1109/TMAG.2009.2024764

Discrete track recording (DTR) media which consist of discrete tracks are presently considered a new paradigm to achieve ultra-high areal density in hard disk drives (HDDs). However, due to the presence of the grooves, stable flying of magnetic recording sliders over DTR media is a question of great concern. In this study, planarization of DTR media with hydrogen silsesquioxane (HSQ), a nonmagnetic material, is investigated. Scanning electron microscopy (SEM) of planarized disks showed very good ldquogap fillingrdquo properties of HSQ in the groove area during the planarization process. Atomic force microscopy (AFM) measurements indicated that the residual groove depth of planarized DTR media decreases with decreasing rotating speed of the disk during spin-coating. Improved flyability of magnetic recording sliders over DTR media was observed after planarization.