Quantitative determination of residual active pharmaceutical ingredients and intermediates on equipment surfaces by ion mobility spectrometry

• Published in: Journal of pharmaceutical and biomedical analysis Vol. 51; no. 1; pp. 107 - 113
• Main Authors: Qin, C., Granger, A., Papov, V., McCaffrey, J., Norwood, D.L.
• Format: Journal Article
• Language: English
• Published: England Elsevier B.V 05.01.2010
• Subjects: Cleaning verification; Drug Industry; Equipment Contamination; Ion mobility spectrometry; Pharmaceutical analysis; Pharmaceutical Preparations - chemistry; Reproducibility of Results; Spectrum Analysis - methods; Swab analysis; Time Factors; Ion mobility spectrometry; Cleaning verification; Pharmaceutical analysis; Swab analysis
• ISSN: 0731-7085; 1873-264X
• DOI: 10.1016/j.jpba.2009.08.016

Ion mobility spectrometry (IMS) is an analytical technique that separates ions based on their gas phase mobility at atmospheric pressure. Since gas phase ion mobility is a function of the shape and structure of the ion, this technique has the potential to provide unique specificity and selectivity. Furthermore, IMS is very sensitive (subnanogram detection limits for many small molecules), and a single analysis is typically completed within 1 min. In principle, these features of IMS should make it an ideal choice for use in cleaning verification analysis of pharmaceutical manufacturing equipment. This report describes the successful development and validation of three different equipment cleaning verification methods using IMS. The methods were developed for a specific intermediate (Compound A) in the synthetic route for a drug substance as well as for final drug substances (active pharmaceutical ingredients Compounds B and C). The cleaning verification methods were validated with respect to specificity, linearity, precision, accuracy, stability, and limit-of-quantitation. In all cases, the limits-of-quantitation were determined to be at the nanogram or sub-nanogram level. Both swab and rinse samples collected from the equipment surfaces were successfully analyzed and manufacturing equipment down-time was significantly minimized due to the reduction in cleaning verification analysis time (for example, the total analysis time for more than 30 samples using IMS was reduced to less than 2 h).