A new approach to surface properties of solid electrolyte interphase on a graphite negative electrode
A new method for observing the outermost surface morphology and the thickness of solid electrolyte interphase (SEI) are presented. Low acceleration voltage in extreme high resolution scanning electron microscopy (XHR-SEM) provides detailed information on the SEI surface morphology due to secondary e...
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Published in | Journal of power sources Vol. 247; pp. 307 - 313 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
Amsterdam
Elsevier
01.02.2014
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Subjects | |
Online Access | Get full text |
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Summary: | A new method for observing the outermost surface morphology and the thickness of solid electrolyte interphase (SEI) are presented. Low acceleration voltage in extreme high resolution scanning electron microscopy (XHR-SEM) provides detailed information on the SEI surface morphology due to secondary electron contrast mechanism. Also, XHR-SEM under low acceleration voltage with low energy induced ion etching in x-ray photoelectron spectroscopy (XPS) studies provides valuable information on the SEI layer thickness. More detailed properties of the SEI layer were investigated by transmission electron microscopy (TEM). |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 0378-7753 1873-2755 |
DOI: | 10.1016/j.jpowsour.2013.08.105 |