A new approach to surface properties of solid electrolyte interphase on a graphite negative electrode

A new method for observing the outermost surface morphology and the thickness of solid electrolyte interphase (SEI) are presented. Low acceleration voltage in extreme high resolution scanning electron microscopy (XHR-SEM) provides detailed information on the SEI surface morphology due to secondary e...

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Bibliographic Details
Published inJournal of power sources Vol. 247; pp. 307 - 313
Main Authors LEE, Seon-Hong, YOU, Ho-Gon, HAN, Kyu-Suk, KIM, Jake, JUNG, In-Ho, SONG, Joo-Han
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier 01.02.2014
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Summary:A new method for observing the outermost surface morphology and the thickness of solid electrolyte interphase (SEI) are presented. Low acceleration voltage in extreme high resolution scanning electron microscopy (XHR-SEM) provides detailed information on the SEI surface morphology due to secondary electron contrast mechanism. Also, XHR-SEM under low acceleration voltage with low energy induced ion etching in x-ray photoelectron spectroscopy (XPS) studies provides valuable information on the SEI layer thickness. More detailed properties of the SEI layer were investigated by transmission electron microscopy (TEM).
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
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content type line 23
ISSN:0378-7753
1873-2755
DOI:10.1016/j.jpowsour.2013.08.105